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Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests.
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- Quality & Reliability Engineering International, 2005, v. 21, n. 6, p. 571, doi. 10.1002/qre.670
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- Article
Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 91, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<91::AID-QRE167>3.0.CO;2-7
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- Article
COMPARISON OF CONVENTIONAL AND PSEUDOMORPHIC HEMTs PERFORMANCES BY DRAIN CURRENT TRANSIENT SPECTROSCOPY AND L.F. CHANNEL NOISE.
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- Quality & Reliability Engineering International, 1996, v. 12, n. 4, p. 309, doi. 10.1002/(SICI)1099-1638(199607)12:4<309::AID-QRE37>3.0.CO;2-H
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- Article
NON-DESTRUCTIVE DETECTION AND LOCALIZATION OF DEFECTS IN MULTILAYER CERAMIC CHIP CAPACITORS USING ELECTROMECHANICAL RESONANCES.
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- Quality & Reliability Engineering International, 1996, v. 12, n. 1, p. 43, doi. 10.1002/(SICI)1099-1638(199601)12:1<43::AID-QRE981>3.0.CO;2-O
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- Article
EARLY DETECTION OF AGEING IN SOLDER JOINTS THROUGH LASER PROBE THERMAL ANALYSIS OF THE PELTIER EFFECT.
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- Quality & Reliability Engineering International, 1994, v. 10, n. 4, p. 289, doi. 10.1002/qre.4680100407
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- Article
LOCALIZATION AND CHARACTERIZATION OF LATCH-UP SENSITIVE AREAS USING A LASER BEAM: INFLUENCE ON DESIGN RULES OF ICs IN CMOS TECHNOLOGY.
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- Quality & Reliability Engineering International, 1993, v. 9, n. 6, p. 477, doi. 10.1002/qre.4680090604
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- Article
THERMOREFLECTANCE OPTICAL TEST PROBE FOR THE MEASUREMENT OF CURRENT-INDUCED TEMPERATURE CHANGES IN MICROELECTRONIC COMPONENTS.
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- Quality & Reliability Engineering International, 1993, v. 9, n. 4, p. 303, doi. 10.1002/qre.4680090411
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- Article
LOW FREQUENCY NOISE ANALYSIS TO DETECT THE INFLUENCE OF DEEP LEVELS IN AlGaAs/GaAs HEMTs.
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- Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 301, doi. 10.1002/qre.4680080321
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- Article
ASICs FAILURE ANALYSIS USING TWO COMPLEMENTARY TECHNIQUES: EXTERNAL ELECTRICAL TESTING AND INTERNAL CONTACTLESS LASER BEAM TESTING.
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- Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 213, doi. 10.1002/qre.4680080308
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- Article