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Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer.
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- Sensors (14248220), 2024, v. 24, n. 9, p. 2890, doi. 10.3390/s24092890
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A tabletop X-ray tomography instrument for nanometer-scale imaging: reconstructions.
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- Microsystems & Nanoengineering, 2023, v. 9, n. 1, p. 1, doi. 10.1038/s41378-023-00510-6
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- Article
Performance evaluation of two optical architectures for task-specific compressive classification.
- Published in:
- Optical Engineering, 2020, v. 59, n. 5, p. 51404, doi. 10.1117/1.OE.59.5.051404
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- Publication type:
- Article