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Impact of Solder Voids on IGBT Thermal Behavior: A Multi-Methodological Approach.
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- Electronics (2079-9292), 2024, v. 13, n. 11, p. 2188, doi. 10.3390/electronics13112188
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Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis.
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- Electronics (2079-9292), 2021, v. 10, n. 17, p. 2095, doi. 10.3390/electronics10172095
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Non-Isolated DC-DC Converters in Fuel Cell Applications: Thermal Analysis and Reliability Comparison.
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- Applied Sciences (2076-3417), 2022, v. 12, n. 10, p. 5026, doi. 10.3390/app12105026
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Fabrication of precisely aligned microwire and microchannel structures: Toward heat stimulation of guided neurites in neuronal cultures.
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- Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 9, p. n/a, doi. 10.1002/pssa.201600729
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Unraveling the cause of degradation in Cu(In,Ga)Se<sub>2</sub> photovoltaics under potential induced degradation.
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- Nano Select, 2022, v. 3, n. 1, p. 157, doi. 10.1002/nano.202100122
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- Article
Method to Study Potential‐Induced Degradation of Perovskite Solar Cells and Modules in an Inert Environment.
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- Solar RRL, 2024, v. 8, n. 11, p. 1, doi. 10.1002/solr.202400046
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Cover Image.
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- Progress in Photovoltaics, 2023, v. 31, n. 2, p. i, doi. 10.1002/pip.3669
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In situ quantification of temperature and strain within photovoltaic modules through optical sensing.
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- Progress in Photovoltaics, 2023, v. 31, n. 2, p. 173, doi. 10.1002/pip.3622
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- Article
Why and how to adapt PID testing for bifacial PV modules?
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- Progress in Photovoltaics, 2020, v. 28, n. 10, p. 1045, doi. 10.1002/pip.3311
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- Article
Diamond Nucleation by Carbon Transport from Buried Nanodiamond TiO<sub>2</sub> Sol-Gel Composites.
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- Advanced Materials, 2009, v. 21, n. 6, p. 670, doi. 10.1002/adma.200802305
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Impact of Potential‐Induced Degradation on Different Architecture‐Based Perovskite Solar Cells.
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- Solar RRL, 2021, v. 5, n. 9, p. 1, doi. 10.1002/solr.202100349
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- Article
Potential‐Induced Degradation and Recovery of Perovskite Solar Cells.
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- Solar RRL, 2019, v. 3, n. 10, p. N.PAG, doi. 10.1002/solr.201900226
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- Article
Thermo-Mechanical Stress Comparison of a GaN and SiC MOSFET for Photovoltaic Applications.
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- Energies (19961073), 2020, v. 13, n. 22, p. 5900, doi. 10.3390/en13225900
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- Article
Thermo-Mechanical Stress Comparison of a GaN and SiC MOSFET for Photovoltaic Applications.
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- Energies (19961073), 2020, v. 13, n. 21, p. 5900, doi. 10.3390/en13225900
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- Article
The Sensitivity of an Electro-Thermal Photovoltaic DC–DC Converter Model to the Temperature Dependence of the Electrical Variables for Reliability Analyses.
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- Energies (19961073), 2020, v. 13, n. 11, p. 2865, doi. 10.3390/en13112865
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- Article
Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests.
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- Energies (19961073), 2024, v. 17, n. 11, p. 2616, doi. 10.3390/en17112616
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- Article