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Extended Defects in SiC: Selective Etching and Raman Study.
- Published in:
- Journal of Electronic Materials, 2023, v. 52, n. 8, p. 5039, doi. 10.1007/s11664-023-10272-6
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- Article
Investigation of Three-Step Epilayer Growth Approach of GaN Films to Minimize Compensation.
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- Journal of Electronic Materials, 2005, v. 34, n. 9, p. 1187, doi. 10.1007/s11664-005-0263-6
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- Article
PSYCHIC THERAPEUTICS.
- Published in:
- JAMA: Journal of the American Medical Association, 2001, v. 285, n. 9, p. 1129, doi. 10.1001/jama.285.9.1129
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- Article