Works by Costa, Bruno L.

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 3, p. 329, doi. 10.1007/s10836-021-05952-2

By:

• González, Carlos J.;
• Costa, Bruno L.;
• Machado, Diego N.;
• Vaz, Rafael G.;
• Bôas, Alexis C. Vilas;
• Gonçalez, Odair L.;
• Puchner, Helmut;
• Kastensmidt, Fernanda L.;
• Medina, Nilberto H.;
• Guazzelli, Marcilei A.;
• Balen, Tiago R.

Publication type:

Article