Works by Conard, Thierry
Results: 5
Nano-scale feature analysis achieving high effective lateral resolution with micro-scale material characterization techniques: Application to back-end processing.
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- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 3, p. 506, doi. 10.1002/pssa.201400111
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- Article
Light-Induced Degradation of Polymer:Fullerene Photovoltaic Devices: An Intrinsic or Material-Dependent Failure Mechanism?
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- Advanced Energy Materials, 2014, v. 4, n. 18, p. n/a, doi. 10.1002/aenm.201400848
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- Article
Organic Solar Cells: Light-Induced Degradation of Polymer:Fullerene Photovoltaic Devices: An Intrinsic or Material-Dependent Failure Mechanism? (Adv. Energy Mater. 18/2014).
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- Advanced Energy Materials, 2014, v. 4, n. 18, p. n/a, doi. 10.1002/aenm.201470096
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- Article
New challenges associated with hard X‐ray photoelectron spectroscopy (report on the 2023 ASTM E42‐ASSD AVS workshop).
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- Surface & Interface Analysis: SIA, 2024, v. 56, n. 10, p. 730, doi. 10.1002/sia.7340
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- Article
Surface analysis in the semiconductor industry: Present use and future possibilities.
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- Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 786, doi. 10.1002/sia.6766
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- Article