A Study on the Improvement of Etch Uniformity in an Ion Beam Etcher with a Magnetized Inductively Coupled Plasma Source.Published in:Plasma Physics Reports, 2021, v. 47, n. 3, p. 289, doi. 10.1134/S1063780X21030053By:Cheong, H.-W.;Kim, J.-W.;Kim, K.;Lee, H.Publication type:Article
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