Found: 21
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Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System.
- Published in:
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.297
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- Publication type:
- Article
The IONMASTER magSIMS: An Innovative Multi-ion Species FIB Platform for Correlative High-resolution Ion Microscopy and SIMS Analyses.
- Published in:
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.237
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- Publication type:
- Article
Getting Structural and Compositional Insights into Biological and Beam Sensitive Samples Using Three Complementary Detection Modalities on a Cryo-FIB Instrument.
- Published in:
- 2023
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- Publication type:
- Abstract
SIMS Imaging Performed on Focused Ion Beam - based Platforms.
- Published in:
- 2022
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- Abstract
Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions.
- Published in:
- 2022
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- Publication type:
- Abstract
SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging.
- Published in:
- 2022
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- Abstract
Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging.
- Published in:
- 2021
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- Publication type:
- Abstract
New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy.
- Published in:
- 2021
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- Publication type:
- Abstract
In-situ multi-modal microscopy using finely focused ion and electron beams.
- Published in:
- 2021
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- Publication type:
- Abstract
New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy.
- Published in:
- 2021
- By:
- Publication type:
- Abstract
In-situ multi-modal microscopy using finely focused ion and electron beams.
- Published in:
- 2021
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- Publication type:
- Abstract
npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations.
- Published in:
- 2020
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- Publication type:
- Abstract
Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue.
- Published in:
- 2020
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- Publication type:
- Abstract
Advanced Analytical Capabilities on FIB Instruments Using SIMS.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Advanced Analytical Capabilities on FIB Instruments Using SIMS.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Front Cover: Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation (Small Methods 7/2021).
- Published in:
- Small Methods, 2021, v. 5, n. 7, p. 1, doi. 10.1002/smtd.202170028
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- Publication type:
- Article
Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation.
- Published in:
- Small Methods, 2021, v. 5, n. 7, p. 1, doi. 10.1002/smtd.202100223
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- Publication type:
- Article