Works matching AU Cacho, M.


Results: 19
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    Contact Resistivity of Submicron Hybrid Bonding Pads Down to 400 nm.

    Published in:
    Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4421, doi. 10.1007/s11664-024-11138-1
    By:
    • Lhostis, S.;
    • Ayoub, B.;
    • Sart, C.;
    • Moreau, S.;
    • Souchier, E.;
    • Gusmao Cacho, M. G.;
    • Deloffre, E.;
    • Mermoz, S.;
    • Rey, C.;
    • Le Roux, F.;
    • Aybeke, E.;
    • Gallois-Garreignot, S.;
    • Frémont, H.;
    • Tournier, A.
    Publication type:
    Article
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