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Surface evolution of Ni-V transparent oxide films upon Li insertion reactions.
- Published in:
- Surface & Interface Analysis: SIA, 2002, v. 33, n. 10/11, p. 815, doi. 10.1002/sia.1458
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- Article
Realistic cluster approach for interpreting the valence band structure of phosphorus oxyanions.
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- Surface & Interface Analysis: SIA, 1995, v. 23, n. 7/8, p. 477, doi. 10.1002/sia.740230707
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- Article
XPS investigation on amorphous silion nitride (a-SiNx) chemical structure.
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- Surface & Interface Analysis: SIA, 1988, v. 12, n. 5, p. 323, doi. 10.1002/sia.740120511
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- Article
Atomic force microscopy characterization of sputtered vanadium oxide thin films grown on Al[sub 2] O[sub 3] substrate.
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- Applied Physics A: Materials Science & Processing, 1998, v. 66, n. 7, p. S1175, doi. 10.1007/s003390051321
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- Article
Atomic Force Microscopy Applied to the Study of Whatman Paper Surface Deteriorated by a Cellulolytic Filamentous Fungus.
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- Macromolecular Symposia, 2006, v. 238, n. 1, p. 92, doi. 10.1002/masy.200650613
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- Article
SPECTROMICROSCOPY AND CHEMICAL IMAGING.
- Published in:
- Surface Review & Letters, 1995, v. 2, n. 5, p. 619, doi. 10.1142/S0218625X95000583
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- Article