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Correlative Tomography for Additive Manufacturing of Biomedical Implants.
Published in:
Microscopy & Microanalysis, 2017, v. 23, p. 342, doi. 10.1017/S1431927617002392
By:
- Winiarski, B.;
- Pyka, G.;
- Benedatti, M.;
- Burnett, T. L.;
- Laeveren, D.;
- Dallago, M.;
- Withers, P. J.
Publication type:
Article
Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS.
Published in:
Microscopy & Microanalysis, 2017, v. 23, p. 284, doi. 10.1017/S1431927617002100
By:
- Lindsay, J.;
- Burnett, T. L.;
- Goulden, J.;
- Frankel, P.;
- Garner, A.;
- Winiarski, B.;
- Withers, P. J.
Publication type:
Article
Automated 3D Block Preparation Procedure for Focused Ion Beam 3D Analyses.
Published in:
Microscopy & Microanalysis, 2017, v. 23, p. 286, doi. 10.1017/S1431927617002112
By:
- Zhong, X. L.;
- Withers, P. J.;
- Zhang, X.;
- Lyon, S. B.;
- Burnett, T. L.;
- Zhou, X.;
- Burke, M. G.
Publication type:
Article
Multiscale 3D analysis of creep cavities in AISI type 316 stainless steel.
Published in:
Materials Science & Technology, 2015, v. 31, n. 5, p. 522, doi. 10.1179/1743284714Y.0000000639
By:
- Burnett, T. L.;
- Geurts, R.;
- Jazaeri, H.;
- Northover, S. M.;
- McDonald, S. A.;
- Haigh, S. J.;
- Bouchard, P. J.;
- Withers, P. J.
Publication type:
Article
Correlative Tomography.
Published in:
Scientific Reports, 2014, p. 1, doi. 10.1038/srep04711
By:
- Burnett, T. L.;
- McDonald, S. A.;
- Gholinia, A.;
- Geurts, R.;
- Janus, M.;
- Slater, T.;
- Haigh, S. J.;
- Ornek, C.;
- Almuaili, F.;
- Engelberg, D. L.;
- Thompson, G. E.;
- Withers, P. J.
Publication type:
Article
Xe+ Plasma FIB: 3D Microstructures from Nanometers to Hundreds of Micrometers.
Published in:
Microscopy Today, 2016, v. 24, n. 3, p. 32, doi. 10.1017/S1551929516000316
By:
- Burnett, T. L.;
- Winiarski, B.;
- Kelley, R.;
- Zhong, X. L.;
- Boona, I. N.;
- McComb, D. W.;
- Mani, K.;
- Burke, M. G.;
- Withers, P. J.
Publication type:
Article

Found: 6

Correlative Tomography for Additive Manufacturing of Biomedical Implants.

Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS.

Automated 3D Block Preparation Procedure for Focused Ion Beam 3D Analyses.

Multiscale 3D analysis of creep cavities in AISI type 316 stainless steel.

Correlative Tomography.

Xe+ Plasma FIB: 3D Microstructures from Nanometers to Hundreds of Micrometers.