Works matching AU Burch, Matthew J.

Results: 11

From Microanalysis to Atomic Electron Pair Distribution Function (ePDF): Adding Another Degree of Freedom in Analyzing Nanoscale Materials.

Published in:

2023

By:

Liu, Yang;
Buckett, Mary I;
Jin, Geng Bang;
Burch, Matthew J;
Rosas, Alyssa S;
Thoma, Grant M;
Steinbach, Andy J

Publication type:

Abstract

3D Nanostructures Grown via Focused Helium Ion Beam Induced Deposition.

Published in:

Microscopy & Microanalysis, 2019, p. 332, doi. 10.1017/S1431927618002155

By:

Burch, Matthew J.;
Ievlev, Anton;
Kim, Songkil;
Belianinov, Alex;
Ovchinnikova, Olga S.;
Stanford, Michael G.;
Mahady, Kyle;
Lewis, Brett B.;
Fowlkes, Jason D.;
Rack, Philip D.

Publication type:

Article

3D Nanostructures Grown via Focused Helium Ion Beam Induced Deposition.

Published in:

2018

By:

Burch, Matthew J.;
Ievlev, Anton;
Kim, Songkil;
Belianinov, Alex;
Ovchinnikova, Olga S.;
Stanford, Michael G.;
Mahady, Kyle;
Lewis, Brett B.;
Fowlkes, Jason D.;
Rack, Philip D.

Publication type:

Abstract

Rapid Screening of Nanoporous Structures in SiO<sub>2</sub> Catalyst Particles via Helium Ion Microscopy.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 264, doi. 10.1017/S1431927617002008

By:

Burch, Matthew J.;
Ievlev, Anton V.;
Hysmith, Holland;
Mahady, Kyle;
Rack, Philip D.;
Lubin Luo;
Belianinov, Alex;
Yakovlev, Sergey;
Ovchinnikova, Olga

Publication type:

Article

Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 1720, doi. 10.1017/S1431927617009266

By:

Songkil Kim;
Ievlev, Anton V.;
Vlassiouk, Ivan V.;
Burch, Matthew J.;
Xiahan Sang;
Brown, Chance;
Unocic, Raymond R.;
Belianinov, Alex;
Jesse, Stephen;
Ovchinnikova, Olga S.

Publication type:

Article

Nanofabrication Limits in Layered Ferroelectric Semiconductors via He-ion Beam.

Published in:

Microscopy & Microanalysis, 2017, v. 23, p. 262, doi. 10.1017/S1431927617001994

By:

Hysmith, Holland;
Belianinov, Alex;
Burch, Matthew J.;
Ievlev, Anton V.;
Iberi, Vighter;
Susner, Michael A.;
McGuire, Michael A.;
Maksymovych, Peter;
Chyasnavichyus, Marius;
Jesse, Stephen;
Ovchinnikova, Olga S.

Publication type:

Article

Investigation of Local A-site Chemistry in Barium Strontium Titanate Using Aberration Corrected STEM, EELS and EDS.

Published in:

Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1992, doi. 10.1017/S1431927614011696

By:

Burch, Matthew J.;
Li, Jing;
Garten, Lauren;
Sang, Xiahan;
Lebeau, James;
Trolier-Mckinstry, Susan;
Maria, Jon-Paul;
Dickey, Elizabeth C.

Publication type:

Article

Engineering the thermal conductivity along an individual silicon nanowire by selective helium ion irradiation.

Published in:

Nature Communications, 2017, v. 8, n. 6, p. 15919, doi. 10.1038/ncomms15919

By:

Zhao, Yunshan;
Liu, Dan;
Chen, Jie;
Zhu, Liyan;
Belianinov, Alex;
Ovchinnikova, Olga S.;
Unocic, Raymond R.;
Burch, Matthew J.;
Kim, Songkil;
Hao, Hanfang;
Pickard, Daniel S.;
Li, Baowen;
Thong, John T. L.

Publication type:

Article

Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced Deposition.

Published in:

Micromachines, 2020, v. 11, n. 5, p. 527, doi. 10.3390/mi11050527

By:

Belianinov, Alex;
Burch, Matthew J.;
Ievlev, Anton;
Kim, Songkil;
Stanford, Michael G.;
Mahady, Kyle;
Lewis, Brett B.;
Fowlkes, Jason D.;
Rack, Philip D.;
Ovchinnikova, Olga S.

Publication type:

Article

Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction.

Published in:

Journal of Microscopy, 2022, v. 285, n. 2, p. 85, doi. 10.1111/jmi.13077

By:

Fancher, Chris M.;
Burch, Matthew J.;
Patala, Srikanth;
Dickey, Elizabeth C.

Publication type:

Article

Low-Temperature Control of Twins and Abnormal Grain Growth in BaTiO<sub>3</sub>.

Published in:

Journal of the American Ceramic Society, 2015, v. 98, n. 8, p. 2381, doi. 10.1111/jace.13643

By:

Harris, David T.;
Burch, Matthew J.;
Li, Jing;
Dickey, Elizabeth C.;
Maria, Jon‐Paul;
Viehland, D.

Publication type:

Article