Beam Damage by Transmission Electron Microscopy in FinFet Structures.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Works by Bruley, John
Results: 11
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Beam Damage by Transmission Electron Microscopy in FinFet Structures.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
3
Scientific Program Summary.
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- Microscopy & Microanalysis, 2003, v. 9, p. 16
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- Publication type:
- Article
4
Unconventional magnetoresistance and resistivity scaling in amorphous CoSi thin films.
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- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-71614-w
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- Publication type:
- Article
5
Recent Attempts to Detect Magnesium in a Heavily Doped Sapphire Bicrystal by Spatially Resolved Electron Energy-Loss Spectroscopy.
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- Journal of the American Ceramic Society, 1994, v. 77, n. 9, p. 2273, doi. 10.1111/j.1151-2916.1994.tb04593.x
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- Publication type:
- Article
6
Calcium Concentration Dependence of the Intergranular Film Thickness in Silicon Nitride.
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- Journal of the American Ceramic Society, 1994, v. 77, n. 4, p. 911, doi. 10.1111/j.1151-2916.1994.tb07246.x
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- Publication type:
- Article
7
Chemistry of Basal Plane Defects in Zinc Oxide-Antimony Oxide (0.1 mol%) Ceramics.
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- Journal of the American Ceramic Society, 1992, v. 75, n. 11, p. 3127, doi. 10.1111/j.1151-2916.1992.tb04397.x
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- Publication type:
- Article
8
Switching of ferroelectric polarization in epitaxial BaTiO<sub>3</sub> films on silicon without a conducting bottom electrode.
- Published in:
- Nature Nanotechnology, 2013, v. 8, n. 11, p. 881, doi. 10.1038/nnano.2013.226
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- Publication type:
- Article
9
Switching of ferroelectric polarization in epitaxial BaTiO<sub>3</sub> films on silicon without a conducting bottom electrode.
- Published in:
- Nature Nanotechnology, 2013, v. 8, n. 10, p. 748, doi. 10.1038/nnano.2013.192
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- Publication type:
- Article
10
Dual-Lens Electron Holography for Junction Profiling and Strain Mapping on Semiconductor Devices.
- Published in:
- Electronic Device Failure Analysis, 2014, v. 16, n. 1, p. 4, doi. 10.31399/asm.edfa.2014-1.p004
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- Publication type:
- Article
11
Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep-Resistant Yttrium- and Lanthanum-Doped Alumina Microstructures.
- Published in:
- Journal of the American Ceramic Society, 1999, v. 82, n. 10, p. 2865, doi. 10.1111/j.1151-2916.1999.tb02169.x
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- Publication type:
- Article