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Area-Selective Atomic Layer Deposition of ZnO on Si\SiO 2 Modified with Tris(dimethylamino)methylsilane.
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- Materials (1996-1944), 2023, v. 16, n. 13, p. 4688, doi. 10.3390/ma16134688
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Quantitative analysis of calcium and fluorine by high‐sensitivity low‐energy ion scattering: Calcium fluoride.
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- Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 1000, doi. 10.1002/sia.6889
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The application of low energy ion scattering spectroscopy (LEIS) in sub 28-nm CMOS technology.
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- Surface & Interface Analysis: SIA, 2017, v. 49, n. 12, p. 1175, doi. 10.1002/sia.6312
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- Article
The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS.
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- Journal of Solid State Electrochemistry, 2011, v. 15, n. 5, p. 861, doi. 10.1007/s10008-010-1289-0
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Surface active sites present in the orthorhombic M1 phases: low energy ion scattering study of methanol and allyl alcohol chemisorption over Mo–V–Te–Nb–O and Mo–V–O catalysts.
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- Topics in Catalysis, 2006, v. 38, n. 1-3, p. 41, doi. 10.1007/s11244-006-0069-7
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- Article