Works by Brenneman, William A.
1
- Quality & Reliability Engineering International, 2011, v. 27, n. 3, p. 353, doi. 10.1002/qre.1137
- Kang, Lulu;
- Brenneman, William A.
- Article
2
- Quality & Reliability Engineering International, 2006, v. 22, n. 3, p. 307, doi. 10.1002/qre.772
- Robinson, Timothy J.;
- Brenneman, William A.;
- Myers, William R.
- Article
3
- Quality Engineering, 2022, v. 34, n. 4, p. 446, doi. 10.1080/08982112.2022.2106440
- Anderson-Cook, Christine M.;
- Lu, Lu;
- Brenneman, William;
- De Mast, Jeroen;
- Faltin, Frederick;
- Freeman, Laura;
- Guthrie, William;
- Hoerl, Roger;
- Jensen, Willis;
- Jones-Farmer, Allison;
- Leber, Dennis;
- Patterson, Angela;
- Perry, Marcus;
- Steiner, Stefan H.;
- Stevens, Nathaniel T.
- Article
4
- Quality Engineering, 2022, v. 34, n. 4, p. 426, doi. 10.1080/08982112.2022.2106439
- Anderson-Cook, Christine M.;
- Lu, Lu;
- Brenneman, William;
- De Mast, Jeroen;
- Faltin, Frederick;
- Freeman, Laura;
- Guthrie, William;
- Hoerl, Roger;
- Jensen, Willis;
- Jones-Farmer, Allison;
- Leber, Dennis;
- Patterson, Angela;
- Perry, Marcus;
- Steiner, Stefan H.;
- Stevens, Nathaniel T.
- Article
5
- Journal of Quality Technology, 2022, v. 54, n. 4, p. 441, doi. 10.1080/00224065.2021.1930618
- Krishna, Arvind;
- Joseph, V. Roshan;
- Ba, Shan;
- Brenneman, William A.;
- Myers, William R.
- Article
6
- Journal of Quality Technology, 2022, v. 54, n. 3, p. 290, doi. 10.1080/00224065.2021.1889420
- Li, Yifu;
- Deng, Xinwei;
- Ba, Shan;
- Myers, William R.;
- Brenneman, William A.;
- Lange, Steve J.;
- Zink, Ron;
- Jin, Ran
- Article
7
- Journal of Quality Technology, 2021, v. 53, n. 5, p. 526, doi. 10.1080/00224065.2021.1903822
- Yan, Hao;
- Sergin, Nurettin Dorukhan;
- Brenneman, William A.;
- Lange, Stephen Joseph;
- Ba, Shan
- Article
8
- Journal of Quality Technology, 2005, v. 37, n. 2, p. 130, doi. 10.1080/00224065.2005.11980311
- Myers, William R.;
- Brenneman, William A.;
- Myers, Raymond H.
- Article
9
- Journal of Quality Technology, 2003, v. 35, n. 4, p. 335, doi. 10.1080/00224065.2003.11980231
- Brenneman, William A.;
- Myers, William R.
- Article
10
- Technometrics, 2018, v. 60, n. 2, p. 255, doi. 10.1080/00401706.2017.1345704
- Cao, Fang;
- Ba, Shan;
- Brenneman, William A.;
- Joseph, V. Roshan
- Article
11
- Technometrics, 2016, v. 58, n. 2, p. 255, doi. 10.1080/00401706.2014.985389
- Kang, Lulu;
- Salgado, Javier Cruz;
- Brenneman, William A.
- Article
12
- Technometrics, 2015, v. 57, n. 4, p. 479, doi. 10.1080/00401706.2014.957867
- Ba, Shan;
- Myers, William R.;
- Brenneman, William A.
- Article
13
- Technometrics, 2014, v. 56, n. 2, p. 131, doi. 10.1080/00401706.2014.907657
- Article
15
- Technometrics, 2011, v. 53, n. 2, p. 125, doi. 10.1198/TECH.2011.08132
- Lulu Kang;
- Roshan Joseph, V.;
- Brenneman, William A.
- Article
17
- Technometrics, 2001, v. 43, n. 4, p. 388, doi. 10.1198/00401700152672483
- Brenneman, William A.;
- Nair, Vijayan N.
- Article