Found: 4
Select item for more details and to access through your institution.
Applications of X-Ray Characterization for Advanced Materials in the Electronics Industry.
- Published in:
- Metallurgical & Materials Transactions. Part A, 2010, v. 41, n. 5, p. 1167, doi. 10.1007/s11661-009-0116-7
- By:
- Publication type:
- Article
Innovative Analysis of X-ray Microdiffraction Images on Selected Applications of the Kossel Technique.
- Published in:
- Crystal Research & Technology, 1999, v. 34, n. 1, p. 71, doi. 10.1002/(SICI)1521-4079(199901)34:1<71::AID-CRAT71>3.0.CO;2-6
- By:
- Publication type:
- Article
Measurements of Residual Stresses in Micron Regions by Using Synchrotron Excited Kossel Diffraction.
- Published in:
- Crystal Research & Technology, 1999, v. 34, n. 1, p. 59, doi. 10.1002/(SICI)1521-4079(199901)34:1<59::AID-CRAT59>3.0.CO;2-#
- By:
- Publication type:
- Article
Reliability of non-invasive cardiac output measurement in individuals with tetraplegia.
- Published in:
- Spinal Cord, 2011, v. 49, n. 5, p. 665, doi. 10.1038/sc.2010.173
- By:
- Publication type:
- Article