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  • Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 5, p. 1, doi. 10.1002/aelm.202201212
    By:
    • D'Anna, Nicolò;
    • Ferreira Sanchez, Dario;
    • Matmon, Guy;
    • Bragg, Jamie;
    • Constantinou, Procopios C.;
    • Stock, Taylor J.Z.;
    • Fearn, Sarah;
    • Schofield, Steven R.;
    • Curson, Neil J.;
    • Bartkowiak, Marek;
    • Soh, Y.;
    • Grolimund, Daniel;
    • Gerber, Simon;
    • Aeppli, Gabriel
    Publication type:
    Article