Works matching AU Bragg, Jamie

Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon.

Published in:

Advanced Electronic Materials, 2023, v. 9, n. 5, p. 1, doi. 10.1002/aelm.202201212

By:

• D'Anna, Nicolò;
• Ferreira Sanchez, Dario;
• Matmon, Guy;
• Bragg, Jamie;
• Constantinou, Procopios C.;
• Stock, Taylor J.Z.;
• Fearn, Sarah;
• Schofield, Steven R.;
• Curson, Neil J.;
• Bartkowiak, Marek;
• Soh, Y.;
• Grolimund, Daniel;
• Gerber, Simon;
• Aeppli, Gabriel

Publication type:

Article