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The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces.
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- Analytical & Bioanalytical Chemistry, 2020, v. 412, n. 24, p. 6009, doi. 10.1007/s00216-020-02510-1
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- Article
Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy.
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- Journal of Raman Spectroscopy, 2018, v. 49, n. 2, p. 262, doi. 10.1002/jrs.5275
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- Article
Calcination does not remove all carbon from colloidal nanocrystal assemblies.
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- Nature Communications, 2017, v. 8, n. 1, p. 1, doi. 10.1038/s41467-017-02267-9
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- Article
Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies.
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- Macromolecular Chemistry & Physics, 2016, v. 217, n. 16, p. 1801, doi. 10.1002/macp.201600113
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- Article