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Stress-Induced Domain Structure Formation in Nanodimensional Barium Strontium Titanate Films.
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- Technical Physics Letters, 2005, v. 31, n. 12, p. 1029, doi. 10.1134/1.2150889
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Rationale for the Choice of Design Parameters of Cylindrical Electric-Field Sensors that Increase the Sensitivity of the Sensor.
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- Technical Physics, 2024, v. 69, n. 1, p. 62, doi. 10.1134/S1063784224700324
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- Article
Prerequisites for Construction of a Device for Measurements of Electric Field Strength with Determination of the Measurement Error.
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- Technical Physics, 2024, v. 69, n. 1, p. 68, doi. 10.1134/S1063784224700336
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- Article
Polarization Switching along a Substrate in Thin Bi4Ti3O12 Films under Different Deformation Stresses.
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- Technical Physics, 2020, v. 65, n. 1, p. 118, doi. 10.1134/S1063784220010193
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- Article
Structure and Polarization Relaxation of Ba<sub>0.5</sub>Sr<sub>0.5</sub>Nb<sub>2</sub>O<sub>6</sub>/(001)Si Films.
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- Technical Physics, 2018, v. 63, n. 3, p. 407, doi. 10.1134/S1063784218030179
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- Article
Piezoelectric activity of thin PTZ films.
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- Technical Physics, 2009, v. 54, n. 8, p. 1176, doi. 10.1134/S1063784209080131
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- Article
Dynamics of Polarization Reversal in Thin PZT Films.
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- Technical Physics, 2005, v. 50, n. 8, p. 1089, doi. 10.1134/1.2014544
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- Article