Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species.Published in:Journal of Integrated Circuits & Systems, 2024, v. 19, n. 3, p. 1, doi. 10.29292/jics.v19i3.933By:Santos, Julia T.;Bianchi, Reinaldo A. C.;Guazzelli, Marcilei A.;de Oliveira, Juliano A.;Alberton, Saulo G.;Giacomini, Renato C.Publication type:Article