Found: 12
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Chemical interactions in the layered system BCN/Ni(Cu)/Si, produced by CVD at high temperature.
- Published in:
- Analytical & Bioanalytical Chemistry, 2012, v. 404, n. 2, p. 479, doi. 10.1007/s00216-012-6177-2
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- Article
A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin.
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- XRS: X-ray Spectrometry, 2018, v. 47, n. 5, p. 341, doi. 10.1002/xrs.2948
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- Article
CASTOR, a new instrument for combined XRR-GIXRF analysis at SOLEIL.
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- XRS: X-ray Spectrometry, 2017, v. 46, n. 5, p. 303, doi. 10.1002/xrs.2742
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- Article
Chemical character of BC.
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- XRS: X-ray Spectrometry, 2009, v. 38, n. 1, p. 68, doi. 10.1002/xrs.1117
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- Article
Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic.
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- XRS: X-ray Spectrometry, 2008, v. 37, n. 4, p. 462, doi. 10.1002/xrs.1073
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- Article
Characterization of iron-gall inks in historical manuscripts and music compositions using x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 4, p. 234, doi. 10.1002/xrs.677
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- Article
First results of TXRF measurements of low- Z elements on Si wafer surfaces at the PTB plane grating monochromator beamline for undulator radiation at BESSY II.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 1, p. 24, doi. 10.1002/xrs.463
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- Article
F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions.
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- Powder Diffraction, 2010, v. 25, n. 2, p. 221, doi. 10.1154/1.3455044
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- Article
F-62 Characterization of Nanoparticles with X-ray Spectrometry Under Grazing Incidence Conditions.
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- Powder Diffraction, 2010, v. 25, n. 2, p. 221, doi. 10.1154/1.3455043
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- Article
F-61 Depth-Resolved Speciation of Buried Nanolayers.
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- Powder Diffraction, 2010, v. 25, n. 2, p. 215, doi. 10.1154/1.3454995
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- Article
F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF.
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- Powder Diffraction, 2010, v. 25, n. 2, p. 211, doi. 10.1154/1.3454951
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- Publication type:
- Article
Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS.
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- Powder Diffraction, 2004, v. 19, n. 1, p. 81, doi. 10.1154/1.1649327
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- Article