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Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests.
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- Quality & Reliability Engineering International, 2005, v. 21, n. 6, p. 571, doi. 10.1002/qre.670
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Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 91, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<91::AID-QRE167>3.0.CO;2-7
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NON-DESTRUCTIVE DETECTION AND LOCALIZATION OF DEFECTS IN MULTILAYER CERAMIC CHIP CAPACITORS USING ELECTROMECHANICAL RESONANCES.
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- Quality & Reliability Engineering International, 1996, v. 12, n. 1, p. 43, doi. 10.1002/(SICI)1099-1638(199601)12:1<43::AID-QRE981>3.0.CO;2-O
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