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Wavelength- and energy-dispersive Electron Probe Microanalysis (EPMA) measurements with non-perpendicular incidence of the electron beam.
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- Journal of Microscopy, 2006, v. 224, n. 1, p. 52, doi. 10.1111/j.1365-2818.2006.01662.x
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- Article
Extension of PROZA96 to conditions of non-perpendicular incidence of the electron beam.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 6, p. 382, doi. 10.1002/xrs.512
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- Article
An experimental approach to the determination of the surface ionization φ(0) in electron probe microanalysis.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 4, p. 216, doi. 10.1002/xrs.491
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- Article
A systematic database of thin-film measurements by EPMA Part II-Palladium films.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 373, doi. 10.1002/1097-4539(200009/10)29:5<373::AID-XRS442>3.0.CO;2-S
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- Article
A systematic database of thin-film measurements by EPMA Part I - Aluminum films.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 212, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<212::AID-XRS422>3.0.CO;2-K
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- Article
PROZA96: an improved matrix correction program for electron probe microanalysis, based on a double Gaussian φ(ρ z) approach.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 3, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<3::AID-XRS227>3.0.CO;2-L
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- Article
The influence of oxide surface layers on bulk electron probe microanalysis of oxygen-application to Ti-Si-O compounds.
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- Scanning, 1993, v. 15, n. 3, p. 165, doi. 10.1002/sca.4950150310
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- Article
Quantitative electron probe microanalysis of nitrogen.
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- Scanning, 1991, v. 13, n. 5, p. 325, doi. 10.1002/sca.4950130502
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Quantitative electron probe microanalysis of ultralight elements (boron-oxygen).
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- Scanning, 1990, v. 12, n. 4, p. 225, doi. 10.1002/sca.4950120408
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- Article
Progress in Electron Probe Microanalysis.
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- Materialwissenschaft und Werkstoffechnik, 1990, v. 21, n. 2, p. 90, doi. 10.1002/mawe.19900210210
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- Article
A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis.
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- Scanning, 1986, v. 8, n. 2, p. 45, doi. 10.1002/sca.4950080204
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- Article
Quantitative electron probe microanalysis of carbon in binary carbides. I-principles and procedures.
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- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 135, doi. 10.1002/xrs.1300150212
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- Article
Quantitative electron probe microanalysis of carbon in binary carbides. II.
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- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 143, doi. 10.1002/xrs.1300150213
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- Article
The performance of the modified Φ(ϱz) approach as compared to the love and scott, ruste and standard ZAF correction procedures in quantitative electron probe microanalysis.
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- Scanning, 1984, v. 6, n. 1, p. 58, doi. 10.1002/sca.4950060102
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- Article
Evaluation of the use of Gaussian ϕ(ρz) curves in quantitative electron probe microanalysis: A new optimization.
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- XRS: X-ray Spectrometry, 1984, v. 13, n. 2, p. 91, doi. 10.1002/xrs.1300130211
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- Article