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Advanced data analysis techniques for ion beam analysis.
Published in:
Surface & Interface Analysis: SIA, 2003, v. 35, n. 9, p. 760, doi. 10.1002/sia.1599
By:
- N. P. Barradas
Publication type:
Article
Error performance analysis of artificial neural networks applied to Rutherford backscattering.
Published in:
Surface & Interface Analysis: SIA, 2001, v. 31, n. 1, p. 35, doi. 10.1002/sia.949
By:
- Vieira, A.;
- Barradas, N. P.;
- Jeynes, C.
Publication type:
Article
Accurate depth profiling of complex optical coatings.
Published in:
Surface & Interface Analysis: SIA, 2000, v. 30, n. 1, p. 237, doi. 10.1002/1096-9918(200008)30:1<237::AID-SIA751>3.0.CO;2-G
By:
- Jeynes, C.;
- Barradas, N. P.;
- Rafla-Yuan, H.;
- Hichwa, B. P.;
- Close, R.
Publication type:
Article
MAGNETIC ANISOTROPY AND STRUCTURE DEPENDENCE OF THE HYPERFINE FIELD IN Co FILMS AND Co/Re MULTILAYERS.
Published in:
International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 1993, v. 7, n. 1-3, p. 470, doi. 10.1142/S0217979293000986
By:
- BARRADAS, N. P.;
- LEAL, J. L.;
- WOLTERS, H.;
- MELO, A. A.;
- SOARES, J. C.;
- da SILVA, M. F.;
- MELO, L. V.;
- FREITAS, P. P.;
- TRINDADE, I.;
- SWINNEN, B.;
- ROTS, M.
Publication type:
Article
PIXE analysis of multilayer targets.
Published in:
XRS: X-ray Spectrometry, 2011, v. 40, n. 3, p. 153, doi. 10.1002/xrs.1322
By:
- Reis, M. A.;
- Barradas, N. P.;
- Chaves, P. C.;
- Taborda, A.
Publication type:
Article
DT2, a PIXE spectra simulation and fitting package.
Published in:
XRS: X-ray Spectrometry, 2008, v. 37, n. 2, p. 100, doi. 10.1002/xrs.1027
By:
- Reis, M. A.;
- Chaves, P. C.;
- Alves, L. C.;
- Barradas, N. P.
Publication type:
Article
Accurate calculation of pileup effects in PIXE spectra from first principles.
Published in:
XRS: X-ray Spectrometry, 2006, v. 35, n. 4, p. 232, doi. 10.1002/xrs.903
By:
- Barradas, N. P.;
- Reis, M. A.
Publication type:
Article
Detection angle resolved PIXE and the equivalent depth concept for thin film characterization.
Published in:
XRS: X-ray Spectrometry, 2005, v. 34, n. 4, p. 372, doi. 10.1002/xrs.841
By:
- Reis, M. A.;
- Chaves, P. C.;
- Corregidor, V.;
- Barradas, N. P.;
- Alves, E.;
- Dimroth, F.;
- Bett, A. W.
Publication type:
Article
Al1− xIn xN/GaN bilayers: Structure, morphology, and optical properties.
Published in:
Physica Status Solidi (B), 2010, v. 247, n. 7, p. 1740, doi. 10.1002/pssb.200983656
By:
- Lorenz, K.;
- Magalhães, S.;
- Franco, N.;
- Barradas, N. P.;
- Darakchieva, V.;
- Alves, E.;
- Pereira, S.;
- Correia, M. R.;
- Munnik, F.;
- Martin, R. W.;
- O'Donnell, K. P.;
- Watson, I. M.
Publication type:
Article
The effect of metal-rich growth conditions on the microstructure of Sc xGa1− xN films grown using molecular beam epitaxy.
Published in:
Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 12, p. 2837, doi. 10.1002/pssa.201532292
By:
- Tsui, H. C. L.;
- Goff, L. E.;
- Barradas, N. P.;
- Alves, E.;
- Pereira, S.;
- Beere, H. E.;
- Farrer, I.;
- Nicoll, C. A.;
- Ritchie, D. A.;
- Moram, M. A.
Publication type:
Article
Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride).
Published in:
Journal of Materials Science, 2001, v. 36, n. 19, p. 4731, doi. 10.1023/A:1017979005467
By:
- Ross, G. J.;
- Barradas, N. P.;
- Hill, M. P.;
- Jeynes, C.;
- Morrissey, P.;
- Watts, J. F.
Publication type:
Article
High Resolution IBA Analysis of Spin Dependent Tunnel Junctions.
Published in:
Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1288, doi. 10.1142/S0217984901003184
By:
- Barradas, N. P.;
- Da Silva, M. F.;
- Soares, J. C.;
- Kreissig, U.;
- Arnoldbik, W. M.;
- Cardoso, S.;
- Freitas, P. P.
Publication type:
Article
BRS Analysis of MBE Grown SiGe/(001)Si Heterostructures with Thin High Ge Content SiGe Channels for HMOS Transistors.
Published in:
Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1297, doi. 10.1142/S0217984901003196
By:
- Barradas, N. P.;
- Sequeira, A. D.;
- Franco, N.;
- Myronov, M.;
- Mironov, O. A.;
- Phillips, P. J.;
- Parker, E. H. C.
Publication type:
Article
Functional behaviour of TiO 2 films doped with noble metals.
Published in:
Surface Engineering, 2016, v. 32, n. 8, p. 554, doi. 10.1179/1743294415Y.0000000085
By:
- Rodrigues, M. S.;
- Borges, J.;
- Gabor, C.;
- Munteanu, D.;
- Apreutesei, M.;
- Steyer, P.;
- Lopes, C.;
- Pedrosa, P.;
- Alves, E.;
- Barradas, N. P.;
- Cunha, L.;
- Martínez-Martínez, D.;
- Vaz, F.
Publication type:
Article

Found: 14

Advanced data analysis techniques for ion beam analysis.

Error performance analysis of artificial neural networks applied to Rutherford backscattering.

Accurate depth profiling of complex optical coatings.

MAGNETIC ANISOTROPY AND STRUCTURE DEPENDENCE OF THE HYPERFINE FIELD IN Co FILMS AND Co/Re MULTILAYERS.

PIXE analysis of multilayer targets.

DT2, a PIXE spectra simulation and fitting package.

Accurate calculation of pileup effects in PIXE spectra from first principles.

Detection angle resolved PIXE and the equivalent depth concept for thin film characterization.

Al<sub>1− x</sub>In<sub> x</sub>N/GaN bilayers: Structure, morphology, and optical properties.

The effect of metal-rich growth conditions on the microstructure of Sc <sub>x</sub>Ga<sub>1− x</sub>N films grown using molecular beam epitaxy.

Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride).

High Resolution IBA Analysis of Spin Dependent Tunnel Junctions.

BRS Analysis of MBE Grown SiGe/(001)Si Heterostructures with Thin High Ge Content SiGe Channels for HMOS Transistors.

Functional behaviour of TiO 2 films doped with noble metals.