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Spatial variations of carrier and defect concentration in VGF GaAs:Si.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 165, doi. 10.1007/s10854-007-9532-x
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- Publication type:
- Article
Static and dynamic characterization of AlN and nanocrystalline diamond membranes.
- Published in:
- 2012
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- Publication type:
- Editorial
Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy.
- Published in:
- Journal of Electronic Materials, 2010, v. 39, n. 6, p. 756, doi. 10.1007/s11664-010-1120-9
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- Publication type:
- Article