Works matching AU Bôas, Alexis C. Vilas

Results: 3
    1

    Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs.

    Published in:
    Electronics (2079-9292), 2025, v. 14, n. 11, p. 2288, doi. 10.3390/electronics14112288
    By:
    • Alberton, Saulo G.;
    • Aguiar, Vitor A. P.;
    • Added, Nemitala;
    • Vilas-Bôas, Alexis C.;
    • Guazzelli, Marcilei A.;
    • Wyss, Jeffery;
    • Silvestrin, Luca;
    • Mattiazzo, Serena;
    • Pereira, Matheus S.;
    • Finco, Saulo;
    • Paccagnella, Alessandro;
    • Medina, Nilberto H.
    Publication type:
    Article
    2

    Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions.

    Published in:
    Journal of Integrated Circuits & Systems, 2021, v. 16, n. 3, p. 1, doi. 10.29292/jics.v16i3.567
    By:
    • González, Carlos J.;
    • Machado, Diego N.;
    • Vaz, Rafael G.;
    • Bôas, Alexis C. Vilas;
    • Gonçalez, Odair L.;
    • Puchner, Helmut;
    • Added, Nemitala;
    • Macchione, Eduardo L. A.;
    • Aguiar, Vitor A. P.;
    • Kastensmidt, Fernanda L.;
    • Medina, Nilberto H.;
    • Guazzelli, Marcilei A.;
    • Balen, Tiago R.
    Publication type:
    Article
    3

    Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

    Published in:
    Journal of Electronic Testing, 2021, v. 37, n. 3, p. 329, doi. 10.1007/s10836-021-05952-2
    By:
    • González, Carlos J.;
    • Costa, Bruno L.;
    • Machado, Diego N.;
    • Vaz, Rafael G.;
    • Bôas, Alexis C. Vilas;
    • Gonçalez, Odair L.;
    • Puchner, Helmut;
    • Kastensmidt, Fernanda L.;
    • Medina, Nilberto H.;
    • Guazzelli, Marcilei A.;
    • Balen, Tiago R.
    Publication type:
    Article