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Works matching AU Argenti, N.

Results: 3

1

Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices.

Published in:

Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 1392, doi. 10.1017/S1431927609097244

By:

McMahon, G;
Rybczynski, J;
Wang, Y;
Gao, Y;
Argenti, N;
Kempa, K;
Ren, ZF;
Naughton, MJ

Publication type:

Article

2

Efficient nanocoax-based solar cells.

Published in:

Physica Status Solidi - Rapid Research Letters, 2010, v. 4, n. 7, p. 181, doi. 10.1002/pssr.201004154

By:

Naughton, M. J.;
Kempa, K.;
Ren, Z. F.;
Gao, Y.;
Rybczynski, J.;
Argenti, N.;
Gao, W.;
Wang, Y.;
Peng, Y.;
Naughton, J. R.;
McMahon, G.;
Paudel, T.;
Lan, Y. C.;
Burns, M. J.;
Shepard, A.;
Clary, M.;
Ballif, C.;
Haug, F.-J.;
Söderström, T.;
Cubero, O.

Publication type:

Article

3

Applications of Multibeam SEM/FIB Instrumentation in the Integrated Sciences.

Published in:

Microscopy Today, 2009, v. 17, n. 4, p. 34, doi. 10.1017/S1551929509000133

By:

McMahon, G.;
Rybczynski, J.;
Wang, Y.;
Gao, Y.;
Cai, D.;
Dhakal, P.;
Argenti, N.;
Kempa, K.;
Ren, Z.F.;
Erdman, N.;
Naughton, M.J.

Publication type:

Article