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Atomic Layer Deposition Brings Applications of Two-Dimensional Silica to the Fore.
- Published in:
- Catalysis Letters, 2024, v. 154, n. 4, p. 1359, doi. 10.1007/s10562-023-04435-7
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- Article
Size and Shape Exclusion in 2D Silicon Dioxide Membranes.
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- Small, 2023, v. 19, n. 9, p. 1, doi. 10.1002/smll.202205602
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- Article
Size and Shape Exclusion in 2D Silicon Dioxide Membranes.
- Published in:
- Small, 2023, v. 19, n. 9, p. 1, doi. 10.1002/smll.202205602
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- Article
Crystalline Insulators: Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films (Adv. Mater. Interfaces 2/2017).
- Published in:
- Advanced Materials Interfaces, 2017, v. 4, n. 2, p. n/a, doi. 10.1002/admi.201770014
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- Article
Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films.
- Published in:
- Advanced Materials Interfaces, 2017, v. 4, n. 2, p. n/a, doi. 10.1002/admi.201601011
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- Article
A highly active and stable hydrogen evolution catalyst based on pyrite-structured cobalt phosphosulfide.
- Published in:
- Nature Communications, 2016, v. 7, n. 2, p. 10771, doi. 10.1038/ncomms10771
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- Article
Tunable Hierarchical Metallic-Glass Nanostructures.
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- Advanced Functional Materials, 2013, v. 23, n. 21, p. 2708, doi. 10.1002/adfm.201202887
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- Article
Metallic-Glass Nanostructures: Tunable Hierarchical Metallic-Glass Nanostructures (Adv. Funct. Mater. 21/2013).
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- Advanced Functional Materials, 2013, v. 23, n. 21, p. 2784, doi. 10.1002/adfm.201370104
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- Article
3D Atomic Force Microscopy: Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level (Adv. Mater. 26-27/2010).
- Published in:
- Advanced Materials, 2010, v. 22, n. 26/27, p. n/a, doi. 10.1002/adma.201090089
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- Article
Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level.
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- Advanced Materials, 2010, v. 22, n. 26/27, p. 2838, doi. 10.1002/adma.200903909
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- Article
Mechanisms, Kinetics, and Dynamics of Oxidation and Reactions on Oxide Surfaces Investigated by Scanning Probe Microscopy.
- Published in:
- Advanced Materials, 2010, v. 22, n. 26/27, p. 2854, doi. 10.1002/adma.200903927
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- Article
Achieving A-Site Termination on La<sub>0.18</sub>Sr<sub>0.82</sub>Al<sub>0.59</sub>Ta<sub>0.41</sub>O<sub>3</sub> Substrates.
- Published in:
- Advanced Materials, 2010, v. 22, n. 26/27, p. 2945, doi. 10.1002/adma.200904328
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- Article
Three-dimensional imaging of short-range chemical forces with picometre resolution.
- Published in:
- Nature Nanotechnology, 2009, v. 4, n. 5, p. 307, doi. 10.1038/nnano.2009.57
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- Article