Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species.
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- Journal of Integrated Circuits & Systems, 2024, v. 19, n. 3, p. 1, doi. 10.29292/jics.v19i3.933
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Works matching AU Alberton, Saulo G.
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Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts.
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- Chips, 2025, v. 4, n. 1, p. 12, doi. 10.3390/chips4010012
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