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  • Editorial.

    Published in:
    Journal of Electronic Testing, 2024, v. 40, n. 2, p. 137, doi. 10.1007/s10836-024-06120-y
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • A Survey and Recent Advances: Machine Intelligence in Electronic Testing.

    Published in:
    Journal of Electronic Testing, 2024, v. 40, n. 2, p. 139, doi. 10.1007/s10836-024-06117-7
    By:
    • Roy, Soham;
    • Millican, Spencer K.;
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2024
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2023
    By:
    • D. Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2023
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2023
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Correction Notice

  • Editorial.

    Published in:
    2023
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2023
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2022
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial: JETTA Volume 38, Number 5, October 2022.

    Published in:
    2022
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2022, v. 38, n. 4, p. 335, doi. 10.1007/s10836-022-06023-w
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2022
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2022, v. 38, n. 2, p. 125, doi. 10.1007/s10836-022-06003-0
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2022
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2021
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2021, v. 37, n. 4, p. 423, doi. 10.1007/s10836-021-05970-0
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2021
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2021
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2021
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Estimating Operational Age of an Integrated Circuit.

    Published in:
    Journal of Electronic Testing, 2021, v. 37, n. 1, p. 25, doi. 10.1007/s10836-021-05927-3
    By:
    • Chowdhury, Prattay;
    • Guin, Ujjwal;
    • Singh, Adit D.;
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2020
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures.

    Published in:
    Journal of Electronic Testing, 2020, v. 36, n. 1, p. 123, doi. 10.1007/s10836-020-05859-4
    By:
    • Roy, Soham;
    • Stiene, Brandon;
    • Millican, Spencer K.;
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2019
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2019
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2019
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2019
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2019
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2019, v. 35, n. 1, p. 1, doi. 10.1007/s10836-019-05781-4
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2018, v. 34, n. 6, p. 615, doi. 10.1007/s10836-018-5768-z
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2018
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2018, v. 34, n. 4, p. 371, doi. 10.1007/s10836-018-5743-8
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2018
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Proceeding

  • Editorial.

    Published in:
    Journal of Electronic Testing, 2018, v. 34, n. 2, p. 105, doi. 10.1007/s10836-018-5728-7
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Article

  • Editorial.

    Published in:
    2018
    By:
    • Agrawal, Vishwani D.
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects.

    Published in:
    Journal of Electronic Testing, 2017, v. 33, n. 5, p. 573, doi. 10.1007/s10836-017-5681-x
    By:
    • Zhang, Bei;
    • Agrawal, Vishwani
    Publication type:
    Article

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling.

    Published in:
    Journal of Electronic Testing, 2017, v. 33, n. 2, p. 171, doi. 10.1007/s10836-017-5652-2
    By:
    • Sheshadri, Vijay;
    • Agrawal, Vishwani;
    • Agrawal, Prathima
    Publication type:
    Article

  • Editorial.

    Published in:
    2017
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2016
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2016
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial

  • Editorial.

    Published in:
    2016
    By:
    • Agrawal, Vishwani
    Publication type:
    Editorial