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Studying Thermally Reduced Graphene Oxide by X-Ray Photoelectron Spectroscopy.
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- Journal of Structural Chemistry, 2020, v. 61, n. 5, p. 803, doi. 10.1134/S0022476620050170
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Raman Spectroscopy of Nanopolycrystalline Diamond Produced from Shungite at 15 GPa and 1600°C.
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- JETP Letters, 2020, v. 111, n. 4, p. 218, doi. 10.1134/S0021364020040050
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Measurement of the isotope composition of hydrogen in carbon materials using elastically scattered electron peak spectroscopy.
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- Technical Physics, 2009, v. 54, n. 11, p. 1667, doi. 10.1134/S106378420911019X
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Reflection of keV-Energy Electrons from Multilayer Surfaces.
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- Technical Physics, 2002, v. 47, n. 11, p. 1444
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Analytical Theory of Reflection of Hydrogen Isotopes of Thermonuclear Energies from Construction Materials.
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- Plasma Physics Reports, 2024, v. 50, n. 2, p. 247, doi. 10.1134/S1063780X2360202X
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Determination of Layer-By-Layer Profiles of Hydrogen Isotopes in Carbon and Beryllium Based on Electron Spectroscopy Methods.
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- Plasma Physics Reports, 2023, v. 49, n. 10, p. 1237, doi. 10.1134/S1063780X23601025
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- Article
Peculiarities of the composition of zoned picroilmenites from the Massadou field (Giunea) and Dachnaya pipe (Yakutia) kimberlites.
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- Doklady Earth Sciences, 2010, v. 434, n. 2, p. 1386, doi. 10.1134/S1028334X10100223
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High-pressure etching of diamond in chloride melt in the presence of aqueous fluid.
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- Doklady Earth Sciences, 2010, v. 434, n. 2, p. 1359, doi. 10.1134/S1028334X10100156
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- Article
The Effect of Optical Radiation on the Semiconductor Conductivity in a Thin-Film Ferroelectric–Semiconductor Structure.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 518, doi. 10.1134/1.1773355
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Evaluating Mechanical Stresses in Thin-Film Structures with Ferroelectric PZT Films.
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- Technical Physics Letters, 2004, v. 30, n. 3, p. 228, doi. 10.1134/1.1707176
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Specific Properties of the PZT-Based Thin-Film Capacitor Structures with Excess Lead Oxide.
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- Technical Physics Letters, 2001, v. 27, n. 6, p. 467
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- Article
Effect of Thermal Treatment on Structure and Properties of a-Si:H Films Obtained by Cyclic Deposition.
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- Semiconductors, 2002, v. 36, n. 2, p. 230
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Electrical and Photoelectric Properties of a-Si:H Layered Films: The Influence of Thermal Annealing.
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- Semiconductors, 2001, v. 35, n. 3, p. 353, doi. 10.1134/1.1356161
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Structure and Properties of a-Si:H Films Grown by Cyclic Deposition.
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- Semiconductors, 2000, v. 34, n. 4, p. 477
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Inelastic Processes in a Gas-Discharge Plasma of Inert Gases.
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- High Temperature, 2018, v. 56, n. 5, p. 621, doi. 10.1134/S0018151X18050012
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- Article
Raman Spectroscopy of Impact Popigai Astrobleme Diamonds Heat Treated at 5.5 GPa.
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- Journal of Engineering Physics & Thermophysics, 2022, v. 95, n. 7, p. 1688, doi. 10.1007/s10891-022-02638-0
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Coefficients of Light-Ion Reflection from a Solid Surface.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2024, v. 18, n. 4, p. 846, doi. 10.1134/S102745102470054X
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Determination of the Thicknesses of Single-Layer Coatings Exposed to Ion Bombardment by X-Ray Photoelectron Spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 6, p. 1225, doi. 10.1134/S1027451023060022
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- Article
Effect of Aluminum on the Structure and Electrical Properties of Amorphous Diamond-Like Silicon-Carbon Films.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 6, p. 1199, doi. 10.1134/S1027451023060174
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Reflection of Light Ions from a Solid Surface: Analytical Model and Computer Simulation.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 1, p. 78, doi. 10.1134/S1027451023010032
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Influence of Multiple-Elastic-Scattering Processes in Multicomponent Targets on the Intensity of the Peaks of Elastically Reflected Electrons.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2022, v. 16, n. 3, p. 384, doi. 10.1134/S1027451022030193
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Quantitative Interpretation of Electron Spectroscopy Signals. Extracting the Differential Inverse Inelastic Mean Free Path and Differential Surface Excitation Probability in Solids.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2020, v. 14, n. 6, p. 1324, doi. 10.1134/S102745102006021X
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Evolution of Plasma-Excitation Mechanisms in the Process of the Thermal Reduction of Graphene Oxide.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2020, v. 14, n. 2, p. 366, doi. 10.1134/S102745102002041X
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Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 5, p. 828, doi. 10.1134/S1027451019050021
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Tungsten-Containing Phases in Diamond-Like Silicon−Carbon Nanocomposites.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 5, p. 832, doi. 10.1134/S1027451019050124
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Depth Profiling Using Reflected Electron Spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2018, v. 12, n. 6, p. 1194, doi. 10.1134/S1027451018050531
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Determination of the Thickness of Nanofilms Using X-Ray Photoelectron Spectroscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2018, v. 12, n. 6, p. 1182, doi. 10.1134/S1027451018050580
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Transmission Function: Effect of "Brightness-Body Rotation".
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2017, v. 11, n. 6, p. 1296, doi. 10.1134/S1027451017050226
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Raman identification of lonsdaleite in Popigai impactites.
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- Journal of Raman Spectroscopy, 2014, v. 45, n. 4, p. 305, doi. 10.1002/jrs.4457
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- Article