Works by 蔡小龙


Results: 4
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    GaN HEMT 经时击穿可靠性的研究进展.

    Published in:
    Electronic Components & Materials, 2020, v. 39, n. 12, p. 1, doi. 10.14106/j.cnki.1001-2028.2020.0523
    By:
    • 孙梓轩;
    • 蔡小龙;
    • 杜成林;
    • 段向阳;
    • 陆 海
    Publication type:
    Article
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