基于像散的光学元件厚度非接触测量研究.Published in:Laser Technology, 2019, v. 43, n. 6, p. 741, doi. 10.7510/jgjs.issn.1001-3806.2019.06.002By:李潇潇;张志恒;张效宇;曹杰君;曹兆楼Publication type:Article