成型压力对CuFeO<sub>2</sub>陶瓷材料结构和介电性能的影响.Published in:Electronic Components & Materials, 2017, v. 36, n. 12, p. 16, doi. 10.14106/j.cnki.1001-2028.2017.12.004By:谢新宇;代海洋;陈镇平;叶凤娇;谷留停;刘树人Publication type:Article