Works matching Digital Equipment Corporation (DEC)
Results: 14
DEC Is Dead, Long Live DEC: The Lasting Legacy of Digital Equipment Corporation (Book).
- Published in:
- 2004
- By:
- Publication type:
- Book Review
DEC Is Dead, Long Live DEC: The Lasting Legacy of Digital Equipment Corporation.
- Published in:
- 2004
- By:
- Publication type:
- Book Review
DEC Is Dead, Long Live DEC: The Lasting Legacy of Digital Equipment Corporation.
- Published in:
- 2004
- By:
- Publication type:
- Book Review
Genealogy of the computer screen.
- Published in:
- Visual Communication, 2006, v. 5, n. 2, p. 141, doi. 10.1177/1470357206065306
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- Publication type:
- Article
Commentary: The Family as a Metaphor for Culture.
- Published in:
- Journal of Management Inquiry, 1998, v. 7, n. 2, p. 131, doi. 10.1177/105649269872006
- By:
- Publication type:
- Article
A Modern-Day Tragedy.
- Published in:
- Journal of Management Inquiry, 1998, v. 7, n. 2, p. 118, doi. 10.1177/105649269872005
- By:
- Publication type:
- Article
The Demise of Digital Equipment Corporation: Downsizing -- Cause or Cure.
- Published in:
- Zeitschrift für Unternehmensgeschichte, 2010, v. 55, n. 1, p. 82
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- Publication type:
- Article
rehabilitation news.
- Published in:
- Journal of Rehabilitation, 1976, v. 42, n. 1, p. 7
- Publication type:
- Article
KENNETH H. OLSEN.
- Published in:
- Proceedings of the American Philosophical Society, 2014, v. 158, n. 3, p. 293
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- Publication type:
- Article
Building effective learning teams: Lessons from the field.
- Published in:
- SAM Advanced Management Journal (Society for Advancement of Management), 1996, v. 61, n. 3, p. 4
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- Publication type:
- Article
DEC is Dead, Long Live DEC (Book).
- Published in:
- 2003
- By:
- Publication type:
- Book Review
Human and organizational issues in information systems development.
- Published in:
- Behaviour & Information Technology, 1992, v. 11, n. 3, p. 160, doi. 10.1080/01449299208924333
- By:
- Publication type:
- Article
The Determination of Copper Composition Profiles in Semiconductor Device Aluminum Interconnect Electromigration Test Lines using Electron Probe Microanalysis (EPMA).
- Published in:
- Microscopy & Microanalysis, 1998, p. 618, doi. 10.1017/S1431927600023217
- By:
- Publication type:
- Article
DEC Is Dead, Long Live DEC Culture, Consulting, Change: The Story of DEC.
- Published in:
- 2005
- By:
- Publication type:
- Book Review