Works matching DE "WELD thermal simulators"


Results: 56
    1
    2
    3
    4
    5
    6
    7
    8
    9
    10
    11
    12
    13
    14
    15
    16
    17
    18
    19
    20
    21
    22
    23
    24
    25
    26
    27
    28

    69.3: a-IGZO TFTs Reliability Improvement by Dual Gate Structure.

    Published in:
    SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1203, doi. 10.1002/sdtp.10353
    By:
    • Chang, Kuo‐Jui;
    • Chen, Wen‐Tai;
    • Chang, Wei‐Cheng;
    • Chen, Wen‐Pin;
    • Nien, Cheng‐Chung;
    • Shih, Tsung‐Hsiang;
    • Lu, Hsueh‐Hsing;
    • Lin, Yu‐Hsin
    Publication type:
    Article
    29
    30
    31
    32
    33
    34
    35
    36
    37
    38
    39
    40
    41
    42
    43
    44
    45
    46
    47
    48
    49
    50