Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 5
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2013.0177
- C. Jin;
- Mujumdar, M.;
- Alphones, A.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 312, doi. 10.1049/el.2013.0551
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 311, doi. 10.1049/el.2013.0550
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 310, doi. 10.1049/el.2013.0552
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2013.0009
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2013.0005
- Vakili, I.;
- Ohlsson, L.;
- Gustafsson, M.;
- Wernersson, L.-E.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4468
- Romano, P.;
- Rosset, S.;
- Maffli, L.;
- Shea, H.;
- Perruisseau-Carrier, J.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4463
- Heves, E.;
- Ozturk, C.;
- Gurbuz, Y.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4448
- Kasmi, C.;
- Hélier, M.;
- Darces, M.;
- Prouff, E.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4352
- Villa, E.;
- de la Fuente, L.;
- Cagigas, J.;
- Aja, B.;
- Artal, E.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4351
- Ghasemi, A.;
- Burokur, S. N.;
- Dhouibi, A.;
- de Lustrac, A.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4286
- C. Zhang;
- J. Ge;
- J. Li;
- Y. Hu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4280
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4135
- X. Ding;
- S. He;
- F. You;
- S. Xie;
- Z. Hu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4071
- J.-X. Chen;
- C. Shao;
- Q.-Y. Lu;
- H. Tang;
- Z.-H. Bao
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4224
- Guerber, J.;
- Venkatram, H.;
- Gande, M.;
- Moon, U.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3910
- Y. J. Qiu;
- Y. H. Xu;
- R. M. Xu;
- W. G. Lin
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3761
- Alhazime, A.;
- Ding, Y.;
- Nikitichev, D. I.;
- Fedorova, K. A.;
- Krestnikov, I. L.;
- Krakowski, M.;
- Rafailov, E. U.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4247
- Almeida Jr., R. C.;
- Santos, A. F.;
- Assis, K. D. R.;
- Waldman, H.;
- Martins-Filho, J. F.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4033
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4222
- Abdel-Rahman, M.;
- Syaryadhi, M.;
- Debbar, N.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.4217
- H. Y. Choi;
- T. Tsuritani;
- Morita, I.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3590
- Shuo Yang;
- Jie Xu;
- Ming-Hui Wang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1
- N. Hayashi;
- Y. Mizuno;
- K. Nakamura
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3704
- Colace, L.;
- Santoni, F.;
- Assanto, G.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3651
- Cheribi, H.;
- Ghanem, F.;
- Kimouche, H.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3602
- B. Kang;
- O. Choi;
- J. D. Kim;
- D. Hwang
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3752
- Fu-Chang Chen;
- Jie-Ming Qiu;
- Qing-Xin Chu
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3532
- Sheng Hong;
- Bo Zhang;
- Hongqi Yang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3502
- Cho, W.;
- Koschan, A.;
- Abidi, M. A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3495
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3484
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3332
- Zhangming Zhu;
- Yu Xiao;
- Xiaoli Song
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3318
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3222
- Hagem, R. M.;
- Thiel, D. V.;
- O'Keefe, S.;
- Fickenscher, T.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3143
- G. I. Kwon;
- Y. H. Seo;
- H.-S. Yang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.3122
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.0577
- Qureshi, F.;
- Garrido, M.;
- Gustafsson, O.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.2782
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 5, p. 1, doi. 10.1049/el.2012.1221
- Wenbiao Tian;
- Guosheng Rui
- Article