Works matching IS 00218898 AND DT 2010 AND VI 43 AND IP 6

Results: 39

calendar of events.

Published in:: 2010
Publication type:: Calendar

forthcoming meetings.

Published in:: Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1560
Publication type:: Article

AtomSim: web-deployed atomistic dynamics simulator.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1553, doi. 10.1107/S0021889810037209

By:

Keith, J. Brandon;
Fennick, Jacob R.;
Nelson, Daniel R.;
Junkermeier, Chad E.;
Lin, Jiao Y. Y.;
Li, Chen W.;
McKerns, Michael M.;
Lewis, James P.;
Fultz, Brent

Publication type:

Article

DroplIT, an improved image analysis method for droplet identification in high-throughput crystallization trials.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1548, doi. 10.1107/S0021889810040963

By:

Vallotton, Pascal;
Changming Sun;
Lovell, David;
Fazio, Vincent J.;
Newman, Janet

Publication type:

Article

DEBUSSY: a Debye user system for nanocrystalline materials.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1543, doi. 10.1107/S0021889810041889

By:

Cervellino, Antonio;
Giannini, Cinzia;
Guagliardi, Antonietta

Publication type:

Article

ResDe: a new tool for visual definition of distance restraints for crystallographic refinement.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1540, doi. 10.1107/S0021889810038689

By:

Hintze, Bradley J.;
Johnson, Sean J.

Publication type:

Article

Hawk: the image reconstruction package for coherent X-ray diffractive imaging.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1535, doi. 10.1107/S0021889810036083

By:

Maia, Filipe R. N. C.;
Ekeberg, Tomas;
van der Spoel, David;
Hajdu, Janos

Publication type:

Article

Jpowder: a Java-based program for the display and examination of powder diffraction data.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1532, doi. 10.1107/S0021889810041543

By:

Markvardsen, Anders J.;
Puphaiboon, Kreecha;
Arjeneh, Mohammad;
Shankland, Kenneth;
Guest, Hannah L.;
Griffin, Thomas A. N.;
Badham, Daniel R.;
Flannery, Damian W.

Publication type:

Article

X+: a comprehensive computationally accelerated structure analysis tool for solution X-ray scattering from supramolecular self-assemblies.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1522, doi. 10.1107/S0021889810032772

By:

Tal Ben-Nun;
Ginsburg, Avi;
Székely, Pablo;
Raviv, Uri

Publication type:

Article

High diffraction efficiency at hard X-ray energy in a silicon crystal bent by indentation.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1519, doi. 10.1107/S0021889810038343

By:

Barrière, Nicolas;
Guidi, Vincenzo;
Bellucci, Valerio;
Camattari, Riccardo;
Buslaps, Thomas;
Rousselle, Julien;
Roudil, Gilles;
Arnaud, Franois-Xavier;
Bastie, Pierre;
Natalucci, Lorenzo

Publication type:

Article

Diffraction study of protein crystals grown in cryoloops and micromounts.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1513, doi. 10.1107/S0021889810040409

By:

Berger, Michael A.;
Decker, Johannes H.;
Mathews, Irimpan I.

Publication type:

Article

Substrate-controlled allotropic phases and growth orientation of TiO2 epitaxial thin films.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1502, doi. 10.1107/S0021889810041221

By:

Silva, V. F.;
Bouquet, V.;
Députier, S.;
Boursicot, S.;
Ollivier, S.;
Weber, I. T.;
Silva, V. L.;
Santos, I. M. G.;
Guilloux-Viry, M.;
Perrin, A.

Publication type:

Article

Characterization of the parameters relating adjacent grains using transmission electron microscopy.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1495, doi. 10.1107/S002188981004149X

By:

Jeong, H. W.;
Seo, S. M.;
Hong, H. U.;
Yoo, Y. S.

Publication type:

Article

Determination of the β-quartz hexagonal cell parameters from a 00.1 neutron multiple diffraction Umweganregung pattern measured at 1003 K.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1488, doi. 10.1107/S0021889810037969

By:

de Campos, Luiz Carlos;
Ramos Parente, Carlos Benedicto;
Mazzocchi, Vera Lucia

Publication type:

Article

Instrumental developments for anomalous small-angle X-ray scattering from soft matter systems.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1479, doi. 10.1107/S002188981003298X

By:

Sztucki, Michael;
Di Cola, Emanuela;
Narayanan, Theyencheri

Publication type:

Article

Analysis of the Beaucage model.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1474, doi. 10.1107/S0021889810033856

By:

Hammouda, Boualem

Publication type:

Article

DART: a robust algorithm for fast reconstruction of three-dimensional grain maps.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1464, doi. 10.1107/S0021889810034114

By:

Batenburg, K. J.;
Sijbers, J.;
Poulsen, H. F.;
Knudsen, E.

Publication type:

Article

Versatile in situ powder X-ray diffraction cells for solid--gas investigations.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1456, doi. 10.1107/S0021889810038148

By:

Jensen, Torben R.;
Nielsen, Thomas K.;
Filinchuk, Yaroslav;
Jörgensen, Jens-Erik;
Cerenius, Yngve;
Gray, Evan MacA.;
Webb, Colin J.

Publication type:

Article

On uncertainty estimates of crystallographic quantities including cell-parameter uncertainties.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1452, doi. 10.1107/S0021889810039592

By:

Schwarzenbach, Dieter

Publication type:

Article

New approaches to scaling data measured on a CCD diffractometer.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1440, doi. 10.1107/S0021889810037131

By:

Dudka, Alexander

Publication type:

Article

Interface study of a high-performance W/B4C X-ray mirror.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1431, doi. 10.1107/S0021889810036782

By:

Siffalovic, Peter;
Jergel, Matej;
Chitu, Livia;
Majkova, Eva;
Matko, Igor;
Luby, Stefan;
Timmann, Andreas;
Roth, Stephan Volker;
Keckes, Jozef;
Maier, Guenter Alois;
Hembd, Alexandra;
Hertlein, Frank;
Wiesmann, Joerg

Publication type:

Article

A general method to determine twinning elements.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1426, doi. 10.1107/S0021889810037180

By:

Yudong Zhang;
Zongbin Li;
Esling, Claude;
Muller, Jacques;
Xiang Zhao;
Liang Zuo

Publication type:

Article

Potential use of ultrasound to promote protein crystallization.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1419, doi. 10.1107/S0021889810040951

By:

Crespo, Rosa;
Martins, Pedro M.;
Gales, Luís;
Rocha, Fernando;
Damas, Ana M.

Publication type:

Article

The XIPHOS diffraction facility for extreme sample conditions.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1415, doi. 10.1107/S0021889810041282

By:

Probert, Michael R.;
Robertson, Craig M.;
Coome, Jonathan A.;
Howard, Judith A. K.;
Michell, Brian C.;
Goeta, Andrés E.

Publication type:

Article

Evidence for a non-rhombohedral average structure in the lead-free piezoelectric material Na0.5Bi0.5TiO3.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1409, doi. 10.1107/S002188981003342X

By:

Gorfman, S.;
Thomas, P. A.

Publication type:

Article

Combined in situ small- and wide-angle X-ray scattering studies of TiO2 nanoparticle annealing to 1023 K.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1400, doi. 10.1107/S0021889810041907

By:

Kehres, Jan;
Andreasen, Jens Wenzel;
Krebs, Frederik Christian;
Molenbroek, Alfons M.;
Chorkendorff, Ib;
Vegge, Tejs

Publication type:

Article

Determination of twinning relationships between diopside dendrites.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1393, doi. 10.1107/S0021889810033832

By:

Shan-Rong Zhao;
Hai-Jun Xu;
Hong-Wei Liu;
Mason, Roger;
Hui-Fang Liu

Publication type:

Article

Scanning small-angle X-ray scattering analysis of the size and organization of the mineral nanoparticles in fluorotic bone using a stack of cards model.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1385, doi. 10.1107/S0021889810035090

By:

Gourrier, Aurélien;
Chenghao Li;
Siegel, Stefan;
Paris, Oskar;
Roschger, Paul;
Klaushofer, Klaus;
Fratzl, Peter

Publication type:

Article

Asymptotic analysis of small-angle scattering intensities of plane columnar layers.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1377, doi. 10.1107/S0021889810034369

By:

Ciccariello, Salvino

Publication type:

Article

Interesting growth features in potassium dihydrogen phosphate: unravelling the origin and dynamics of point defects in single crystals.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1372, doi. 10.1107/S0021889810033649

By:

Bhagavannarayana, G.;
Rajesh, P.;
Ramasamy, P.

Publication type:

Article

Estimation of errors in diffraction data measured by CCD area detectors.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1356, doi. 10.1107/S0021889810033418

By:

Waterman, David;
Evans, Gwyndaf

Publication type:

Article

Inferential statistics of electron backscatter diffraction data from within individual crystalline grains.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1338, doi. 10.1107/S002188981003027X

By:

Bachmann, Florian;
Hielscher, Ralf;
Jupp, Peter E.;
Pantleon, Wolfgang;
Schaeben, Helmut;
Wegert, Elias

Publication type:

Article

In-crystal chemical ligation for lead compound generation.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1329, doi. 10.1107/S0021889810037222

By:

Yamane, Junji;
Ohyabu, Naoki;
Min Yao;
Takemoto, Hiroshi;
Tanaka, Isao

Publication type:

Article

Through-thickness texture profiling by energy dispersive synchrotron diffraction.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1322, doi. 10.1107/S0021889810037210

By:

Coelho, R. S.;
Klaus, M.;
Genzel, Ch.

Publication type:

Article

Field-induced phase transition in Bi1/2Na1/2TiO3-based lead-free piezoelectric ceramics.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1314, doi. 10.1107/S0021889810038264

By:

Hinterstein, Manuel;
Knapp, Michael;
Hölzel, Markus;
Wook Jo;
Cervellino, Antonio;
Ehrenberg, Helmut;
Fuess, Hartmut

Publication type:

Article

Observation of unusual temperature-dependent stripes in LiTaO3 and LiTaxNb1-xO3 crystals with near-zero birefringence.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1305, doi. 10.1107/S0021889810033868

By:

Glazer, A. M.;
Nan Zhang;
Bartasyte, Ausrine;
Keeble, D. S.;
Huband, S.;
Thomas, P. A.

Publication type:

Article

Algorithms for the calculation of X-ray diffraction patterns from finite element data.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1287, doi. 10.1107/S0021889810032802

By:

Wintersberger, E.;
Kriegner, D.;
Hrauda, N.;
Stangl, J.;
Bauer, G.

Publication type:

Article

Citations in supplementary material.

Published in:

2010

By:

Weiss, Manfred S.;
Einspahr, Howard;
Baker, Edward N.;
Dauter, Zbigniew;
Kaysser-Pyzalla, Anke R.;
Kostorz, Gernot;
Larsen, Sine

Publication type:

Editorial

Nanostructural analysis of GaN tripods and hexapods grown on c-plane sapphire.

Published in:

Journal of Applied Crystallography, 2010, v. 43, n. 6, p. 1300, doi. 10.1107/S0021889810036472

By:

Sanghwa Lee;
Sohn, Yuri;
Chinkyo Kim;
Dong Ryeol Lee;
Hyun-Hwi Lee

Publication type:

Article

Works matching IS 00218898 AND DT 2010 AND VI 43 AND IP 6

calendar of events.

forthcoming meetings.

AtomSim: web-deployed atomistic dynamics simulator.

DroplIT, an improved image analysis method for droplet identification in high-throughput crystallization trials.

DEBUSSY: a Debye user system for nanocrystalline materials.

ResDe: a new tool for visual definition of distance restraints for crystallographic refinement.

Hawk: the image reconstruction package for coherent X-ray diffractive imaging.

Jpowder: a Java-based program for the display and examination of powder diffraction data.

X+: a comprehensive computationally accelerated structure analysis tool for solution X-ray scattering from supramolecular self-assemblies.

High diffraction efficiency at hard X-ray energy in a silicon crystal bent by indentation.

Diffraction study of protein crystals grown in cryoloops and micromounts.

Substrate-controlled allotropic phases and growth orientation of TiO<sub>2</sub> epitaxial thin films.

Characterization of the parameters relating adjacent grains using transmission electron microscopy.

Determination of the β-quartz hexagonal cell parameters from a 00.1 neutron multiple diffraction Umweganregung pattern measured at 1003 K.

Instrumental developments for anomalous small-angle X-ray scattering from soft matter systems.

Analysis of the Beaucage model.

DART: a robust algorithm for fast reconstruction of three-dimensional grain maps.

Versatile in situ powder X-ray diffraction cells for solid--gas investigations.

On uncertainty estimates of crystallographic quantities including cell-parameter uncertainties.

New approaches to scaling data measured on a CCD diffractometer.

Interface study of a high-performance W/B<sub>4</sub>C X-ray mirror.

A general method to determine twinning elements.

Potential use of ultrasound to promote protein crystallization.

The XIPHOS diffraction facility for extreme sample conditions.

Evidence for a non-rhombohedral average structure in the lead-free piezoelectric material Na<sub>0.5</sub>Bi<sub>0.5</sub>TiO<sub>3</sub>.

Combined in situ small- and wide-angle X-ray scattering studies of TiO<sub>2</sub> nanoparticle annealing to 1023 K.

Determination of twinning relationships between diopside dendrites.

Scanning small-angle X-ray scattering analysis of the size and organization of the mineral nanoparticles in fluorotic bone using a stack of cards model.

Asymptotic analysis of small-angle scattering intensities of plane columnar layers.

Interesting growth features in potassium dihydrogen phosphate: unravelling the origin and dynamics of point defects in single crystals.

Estimation of errors in diffraction data measured by CCD area detectors.

Inferential statistics of electron backscatter diffraction data from within individual crystalline grains.

In-crystal chemical ligation for lead compound generation.

Through-thickness texture profiling by energy dispersive synchrotron diffraction.

Field-induced phase transition in Bi<sub>1/2</sub>Na<sub>1/2</sub>TiO<sub>3</sub>-based lead-free piezoelectric ceramics.

Observation of unusual temperature-dependent stripes in LiTaO<sub>3</sub> and LiTa<sub>x</sub>Nb<sub>1-x</sub>O<sub>3</sub> crystals with near-zero birefringence.

Algorithms for the calculation of X-ray diffraction patterns from finite element data.

Citations in supplementary material.

Nanostructural analysis of GaN tripods and hexapods grown on c-plane sapphire.