Works matching DE "ELECTRIC network analyzers"
1
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1168, doi. 10.1007/s10854-016-5642-7
- Zhao, Shuang;
- Zheng, Ji;
- Shi, Biao;
- He, Lihua;
- Liu, Zhongyi
- Article
2
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12701, doi. 10.1007/s10854-016-5404-6
- Ozturk, Turgut;
- Uluer, İhsan;
- Ünal, İlhami
- Article
3
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4963, doi. 10.1007/s10854-015-3008-1
- Wang, Yang;
- Zuo, Ruzhong;
- Zhang, Jian;
- Qi, Shishun;
- Zhang, Tianwen
- Article
4
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 1127, doi. 10.1007/s10854-013-1699-8
- Unnimaya, A.;
- Suresh, E.;
- Dhanya, J.;
- Ratheesh, R.
- Article
5
- Integrated Ferroelectrics, 2006, v. 86, n. 1, p. 149, doi. 10.1080/10584580601085370
- Lee, Hwan H.;
- Lee, Seung J.;
- Park, Jae Y.
- Article
6
- Integrated Ferroelectrics, 2006, v. 80, n. 1, p. 443, doi. 10.1080/10584580600663300
- Xu, W. C.;
- Wang, D. Y.;
- Tang, X. G.;
- Wang, Y.;
- Chan, H. L. W.
- Article
7
- International Transactions on Electrical Energy Systems, 2015, v. 25, n. 12, p. 3304, doi. 10.1002/etep.2037
- Bagheri, Amir;
- Monsef, Hassan;
- Lesani, Hamid
- Article
8
- International Transactions on Electrical Energy Systems, 2013, v. 23, n. 8, p. 1396, doi. 10.1002/etep.1667
- Helseth, A.;
- Warland, G.;
- Mo, B.
- Article
9
- Progress in Electromagnetics Research B, 2016, v. 65, p. 129, doi. 10.2528/pierb15110602
- Shaowu Huang;
- Beomtaek Lee
- Article
10
- Electronics & Electrical Engineering, 2008, n. 82, p. 69
- Kácsor, G.;
- Špánik, P.;
- Dudrík, J.;
- Luft, M.;
- Szychta, E.
- Article
11
- Computational Economics, 2018, v. 51, n. 3, p. 571, doi. 10.1007/s10614-016-9624-x
- Halkos, George E.;
- Tsilika, Kyriaki D.
- Article
12
- Microwave & Optical Technology Letters, 2000, v. 24, n. 1, p. 63, doi. 10.1002/(SICI)1098-2760(20000105)24:1<63::AID-MOP18>3.0.CO;2-2
- Boulejfen, N.;
- Kouki, A. B.;
- Ghannouchi, F. M.
- Article
13
- Microwave & Optical Technology Letters, 1995, v. 9, n. 5, p. 266, doi. 10.1002/mop.4650090512
- Yeo, S. P.;
- Cheng, M.;
- Bannister, D. J.;
- Ide, J. P.
- Article
14
- Microwave & Optical Technology Letters, 1995, v. 8, n. 2, p. 84, doi. 10.1002/mop.4650080209
- Abou Chahine, S.;
- Huyart, B.;
- Bergeault, E.;
- Jallet, L.
- Article
15
- Microwave & Optical Technology Letters, 1993, v. 6, n. 2, p. 104, doi. 10.1002/mop.4650060206
- Mathew, K. T.;
- Raveendranath, U.
- Article
16
- Microwave & Optical Technology Letters, 1991, v. 4, n. 9, p. 376, doi. 10.1002/mop.4650040913
- Cao Jiang;
- Sun Jia;
- Qishao Zhang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 11, p. 714, doi. 10.1049/el.2018.0788
- Yan Song;
- Yanpeng Li;
- Shuang Pang;
- Shanshan Zhao;
- Hongqiang Wang
- Article
18
- IUP Journal of Science & Technology, 2010, v. 6, n. 4, p. 44
- Hadalgi, P. M.;
- Madhuri, R. G.;
- Mallikarjun, S. L.
- Article
19
- IETE Journal of Research, 2011, v. 57, n. 5, p. 437, doi. 10.4103/0377-2063.90160
- Deshmukh, Amit A.;
- Ray, K. P.
- Article
20
- Radioengineering, 2017, v. 26, n. 1, p. 57, doi. 10.13164/re.2017.0057
- Ali, Wael;
- Ibrahim, Ahmed A.;
- Machac, Jan
- Article
21
- International Journal of Performability Engineering, 2010, v. 6, n. 1, p. 63
- Article
22
- INGENIARE - Revista Chilena de Ingeniería, 2018, v. 26, n. 1, p. 28
- Peña, William Yero;
- Rodríguez, Leuber Rosa;
- Bient, Julio Ramírez;
- León, Pedro García
- Article
23
- INGENIARE - Revista Chilena de Ingeniería, 2009, v. 17, n. 3, p. 337
- Baeza, Jorge Mendoza;
- Lago, Fabian Rojas
- Article
24
- INGENIARE - Revista Chilena de Ingeniería, 2009, v. 17, n. 2, p. 205
- Reyes S., Jerson;
- Morales F., Mariano;
- García-Santander, Luis;
- Pezoa, Jorge E.
- Article
25
- International Journal of Emerging Electric Power Systems, 2011, v. 12, n. 4, p. 1, doi. 10.2202/1553-779X.2693
- Bhalja, Bhavesh;
- Shah, Pragnesh, Jr.;
- Chothani, Nilesh;
- Patel, Navi, Jr.
- Article
26
- International Journal of RF & Microwave Computer-Aided Engineering, 2006, v. 16, n. 6, p. 612, doi. 10.1002/mmce.20184
- Cidronali, A.;
- Loglio, G.;
- Manes, G.
- Article
27
- International Journal of RF & Microwave Computer-Aided Engineering, 2003, v. 13, n. 1, p. 74, doi. 10.1002/mmce.10064
- Pannala, Sreemala;
- Swaminathan, Madhavan
- Article
28
- International Journal of RF & Microwave Computer-Aided Engineering, 2002, v. 12, n. 1, p. 3, doi. 10.1002/mmce.10014
- Jargon, Jeffrey A.;
- Gupta, K. C.;
- DeGroot, Donald C.
- Article
29
- International Journal of RF & Microwave Computer-Aided Engineering, 2001, v. 11, n. 1, p. 33, doi. 10.1002/1099-047X(200101)11:1<33::AID-MMCE4>3.0.CO;2-C
- Jargon, J. A.;
- Gupta, K. C.
- Article
30
- International Journal of RF & Microwave Computer-Aided Engineering, 2000, v. 10, n. 5, p. 319, doi. 10.1002/1099-047X(200009)10:5<319::AID-MMCE7>3.0.CO;2-5
- Jargon, Jeffrey A.;
- Gupta, K. C.;
- DeGroot, Donald C.
- Article
31
- PIERS Proceedings, 2014, p. 2093
- Masahiro Horibe;
- Ryoko Kishikwa
- Article
32
- IT: Information Technology, 2014, v. 56, n. 6, p. 265, doi. 10.1515/itit-2014-1079
- Article
33
- Journal of Microwaves, Optoelectronics & Electromagnetic Applications, 2015, v. 14, n. 1, p. AoP40, doi. 10.1590/2179-10742015v14i1425
- Alkhoder, Assal;
- Abboud, Fariz
- Article
34
- Energies (19961073), 2015, v. 8, n. 4, p. 3034, doi. 10.3390/en8043034
- Alexandros Kordonis;
- Ryo Takahashi;
- Daichi Nishihara;
- Takashi Hikihara
- Article
35
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 4, p. -1, doi. 10.1142/S0218126617500682
- Khinda, Jaspal Singh;
- Tripathy, Malay Ranjan;
- Gambhir, Deepak
- Article
36
- Measurement Techniques, 2016, v. 59, n. 7, p. 765, doi. 10.1007/s11018-016-1044-8
- Savin, A.;
- Guba, V.;
- Bykova, O.
- Article
37
- Electrotechnica & Electronica (E+E), 2018, v. 53, n. 11/12, p. 285
- Tzvetkov, Plamen;
- Galabov, Krasimir;
- Kodjabashev, Ivan
- Article
38
- Journal of Engineering (2314-4912), 2016, p. 1, doi. 10.1155/2016/2863508
- Khanna, Puneet;
- Sharma, Amar;
- Shinghal, Kshitij;
- Kumar, Arun
- Article
39
- Frequenz, 2017, v. 71, n. 1/2, p. 19, doi. 10.1515/freq-2016-0054
- Akhter, Zubair;
- Kumar, Pankaj;
- Akhtar, M. Jaleel
- Article
40
- Frequenz, 2013, v. 67, n. 1/2, p. 17, doi. 10.1515/freq-2012-1043
- Sariri, H.;
- Rahmani, Z.;
- Lalbakhsh, A.;
- Majidifar, S.
- Article
41
- Journal of Engineering Science & Technology Review, 2016, v. 9, n. 1, p. 61
- Elmajid, H.;
- Terhzaz, J.;
- Ammor, H.;
- Chaïbi, M.;
- Sánchez, A. M.
- Article
43
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 10
- Article
44
- EE: Evaluation Engineering, 2019, v. 58, n. 1, p. 6
- Article
47
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1929, doi. 10.1049/el.2016.2955
- Cheng Guo;
- Jin Li;
- Dinh, Duc D.;
- Xiaobang Shang;
- Lancaster, Michael J.;
- Jun Xu
- Article
48
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 23, p. 1958, doi. 10.1049/el.2016.1834
- Buchanan, N. B.;
- Fusco, V.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 17, p. 1218, doi. 10.1049/el.2014.1256
- Lei Lin;
- Shuai Yang;
- Shou-Jia Sun;
- Bian Wu;
- Chang-Hong Liang
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 3, p. 28, doi. 10.1049/el.2012.3339
- Rodriguez-Testera, A.;
- Mojón, O.;
- Boaventura, A. S.;
- Fernandez-Barciela, M.;
- Carvalho, N. Borges;
- Bossche, M. Vanden;
- Pailloncy, G.
- Article