Works matching DE "ELECTRONICS conventions"


Results: 71
    1
    2
    3

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
    Publication type:
    Article
    4

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2016, v. 32, n. 2, p. 109, doi. 10.1007/s10836-016-5575-3
    Publication type:
    Article
    5

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2015, v. 31, n. 4, p. 337, doi. 10.1007/s10836-015-5539-z
    Publication type:
    Article
    6

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
    Publication type:
    Article
    7

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2014, v. 30, n. 1, p. 7, doi. 10.1007/s10836-014-5434-z
    Publication type:
    Article
    8

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2013, v. 29, n. 4, p. 455, doi. 10.1007/s10836-013-5395-7
    Publication type:
    Article
    9

    Calendar.

    Published in:
    2010
    Publication type:
    Calendar
    10
    11
    12

    Diary.

    Published in:
    2009
    Publication type:
    Calendar
    13

    Diary.

    Published in:
    Chemistry & Industry, 2008, n. 13, p. 14
    Publication type:
    Article
    14

    Foreword.

    Published in:
    Journal of Electronic Materials, 2009, v. 38, n. 11, p. 2211, doi. 10.1007/s11664-009-0935-8
    By:
    • Chen, Chih-ming;
    • Chada, Srinivas;
    • Chen, Sinn-wen;
    • Flandorfer, Hans;
    • Lindsay Greer, A.;
    • Lee, Jae-ho;
    • Zeng, Kejun;
    • Yen, Yee-wen;
    • Gierlotka, Wojciech;
    • Wang, Chao-hong
    Publication type:
    Article
    15
    16
    17
    18
    19
    20
    21
    22
    23
    24
    25
    26
    27

    ESREF 2017.

    Published in:
    2017
    Publication type:
    Proceeding
    28
    29
    30
    31
    32
    33

    ESREF 2010.

    Published in:
    2010
    Publication type:
    Proceeding
    34
    35
    36
    37
    38

    Events.

    Published in:
    Journal of Failure Analysis & Prevention, 2016, v. 16, n. 5, p. 728, doi. 10.1007/s11668-016-0176-0
    Publication type:
    Article
    39
    40

    Guest Editorial.

    Published in:
    Ferroelectrics, 2008, v. 372, n. 1, p. 5, doi. 10.1080/00150190802435526
    By:
    • Luk'yanchuk, Igor;
    • Mezzane, Daoud
    Publication type:
    Article
    41
    42
    43
    44
    45
    46
    47
    48
    49
    50

    Guest Editorial.

    Published in:
    2013
    By:
    • Dai, Jiyan;
    • Auciello, Orlando;
    • Chan, Helen
    Publication type:
    Editorial