Works matching IS 00218898 AND DT 2009 AND VI 42 AND IP 3

Results: 32

calendar of events.

Published in:: 2009
Publication type:: Calendar

forthcoming meetings.

Published in:: Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 550
Publication type:: Article

Richard J. Weiss (1923-2008).

Published in:

2009

By:

Cooper, Malcolm John

Publication type:

Obituary

Dominique Grebille (1957-2009).

Published in:

2009

By:

Pé, Olivier;
Berar, Jean-Françoise;
Chateigner, Daniel

Publication type:

Obituary

addenda and errata.

Published in:

2009

By:

Yokoyama, Ryouichi;
Harada, Jimpei

Publication type:

Correction Notice

Crystallization columns in a laboratory furnace.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 545, doi. 10.1107/S0021889809014149

By:

Cabric, Branislav;
Danilovic, Nebojsa

Publication type:

Article

HATODAS II - heavy-atom database system with potentially scoring.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 540, doi. 10.1107/S0021889809012370

By:

Sugahara, Michihiro;
Asada, Yukuhiko;
Shimada, Hiroki;
Taka, Hideyuki;
Kunishima, Naoki

Publication type:

Article

ReX: a computer program for structural analysis using powder diffraction data.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 538, doi. 10.1107/S0021889809008309

By:

Bortolotti, Mauro;
Lutterotti, Luca;
Lonardelli, Ivan

Publication type:

Article

The pseudo-single-crystal method: a third approach to crystal structure determination.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 535, doi. 10.1107/S0021889809013430

By:

Kimura, Tsunehisa;
Chang, Chengkang;
Kimura, Fumiko;
Maeyama, Masataka

Publication type:

Article

A sample cell for diffraction studies with control of temperature, relative humidity and applied electric field.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 531, doi. 10.1107/S0021889809009157

By:

Mo, Frode;
Ramsøskar, Kjell

Publication type:

Article

Facilitating protein crystal cryoprotection in thick-walled plastic capillaries by high-pressure cryocooling.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 525, doi. 10.1107/S0021889809011315

By:

Tate, Mark W.;
Gruner, Sol M.;
Yi-Fan Chen

Publication type:

Article

Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 519, doi. 10.1107/S0021889809013107

By:

Esling, Claude;
Muller, Jacques;
Lecomte, Jean-Sébastien;
Qin, Gaowu W.;
Song Li;
Yudong Zhang;
Xiang Zhao;
Liang Zuo

Publication type:

Article

Determination of the degree of preferred orientation within the March-Dollase approach.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 513, doi. 10.1107/S0021889809013727

By:

Zolotoyabko, Emil

Publication type:

Article

Energy-dispersive diffraction studies of inert anodes.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 502, doi. 10.1107/S0021889809008681

By:

Scarlett, Nicola V. Y.;
Madsen, Ian C.;
Evans, John S. O.;
Coelho, Alan A.;
McGregor, Katherine;
Rowles, Matthew;
Lanyon, Marshall R.;
Urban, Andrew J.

Publication type:

Article

Anisotropic phonon density of states: the application of Rietveld and Mössbauer texture analysis in aligned powders.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 496, doi. 10.1107/S0021889809010747

By:

Rykov, A. I.;
Seto, M.;
Ueda, Y.;
Nomura, K.

Publication type:

Article

Lattice parameter determination using a curved position-sensitive detector in reflection geometry and application to Smx/2Ndx/2Ce1-xO1-δ ceramics.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 490, doi. 10.1107/S0021889809010085

By:

Pramanick, A.;
Omar, S.;
Nino, J. C.;
Jones, J. L.

Publication type:

Article

High-performance compact-multi-crystal analyzer of X-ray diffractometer scans.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 485, doi. 10.1107/S0021889809008966

By:

Toraya, Hideo

Publication type:

Article

Ultra-small-angle X-ray scattering at the Advanced Photon Source.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 469, doi. 10.1107/S0021889809008802

By:

Ilavsky, Jan;
Jemian, Pete R.;
Allen, Andrew J.;
Fan Zhang;
Levine, Lyle E.;
Long, Gabrielle G.

Publication type:

Article

On the tetragonality of the room-temparature ferroelectric phase of barium titanate, BatiO3.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 480, doi. 10.1107/S0021889809008310

By:

Keeble, Dean S.;
Thomas, Pamela A.

Publication type:

Article

High-pressure small-angle neutron scattering studies of glucose isomerase conformation in solution.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 461, doi. 10.1107/S0021889809007456

By:

Banachowicz, Ewa;
Kozak, Maciej;
Patkowski, Adam;
Meier, Gerhard;
Kohlbrecher, Joachim

Publication type:

Article

A prototype environmental gas cell for in situ small-molecule X-ray diffraction.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 457, doi. 10.1107/S0021889809010036

By:

Warren, John E.;
Pritchard, Robin G.;
Abram, Don;
Davies, Hazel M.;
Savarese, Teresa L.;
Cash, Ryan J.;
Raithby, Paul R.;
Morris, Russell;
Jones, Richard H.;
Teat, Simon J.

Publication type:

Article

Size distribution and surface characteristics of silicon nanoparticles.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 448, doi. 10.1107/S0021889809011947

By:

Britton, D. T.;
Odo, E. A.;
Gonfa, G. Goro;
Jonah, E. O.;
Härting, M.

Publication type:

Article

Enantiomorph identification and stacking faultsin κ-(BEDT-TTF)2Cu(NCS)2 by convergent-beam electron diffraction.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 433, doi. 10.1107/S0021889809015702

By:

Fujio, Satoshi;
Tanaka, Katsushi;
Inui, Haruyuki;
Ueji, Rintaro;
Sumida, Naoto;
Yamochi, Hideki;
Saito, Gunzi

Publication type:

Article

Coordination number in ideal spherical nanocrystals.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 442, doi. 10.1107/S0021889809012412

By:

Pirkkalainen, Kari;
Serimaa, Ritva

Publication type:

Article

Preferred orientation of ettringite in concrete fractures.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 429, doi. 10.1107/S0021889809015349

By:

Wenk, Hans-Rudolf;
Monteiro, Paulo J. M.;
Kunz, Martin;
Kai Chen;
Tamura, Nobumichi;
Lutterotti, Luca;
Del Arroz, John

Publication type:

Article

Elastic constants of fibre-textured thin films determined by X-ray diffraction.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 416, doi. 10.1107/S0021889809011807

By:

Martinschitz, K. J.;
Daniel, R.;
Mitterer, C.;
Keckes, J.

Publication type:

Article

Morphology and etch figures of a YB: YAI3(BO3)4.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 411, doi. 10.1107/S002188980901036X

By:

Shan Rong Zhao;
Jie Meng;
Rong Wang;
Zhi Hui Qiu;
Li Jie Wang

Publication type:

Article

A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 401, doi. 10.1107/S0021889809006888

By:

Ying, Andrew J.;
Murray, Conal E.;
Noyan, I. C.

Publication type:

Article

High-energy X-ray diffuse scattering.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 392, doi. 10.1107/S0021889809011492

By:

Ramsteiner, I. B.;
Schöps, A.;
Reichert, H.;
Dosch, H.;
Honkimäki, V.;
Zhong, Z.;
Hastings, J. B.

Publication type:

Article

Implementation and use of robust refinement in powder diffraction in the presence of impurities.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 385, doi. 10.1107/S0021889809008450

By:

Stone, Kevin H.;
Lapidus, Saul H.;
Stephens, Peter W.

Publication type:

Article

PDB_REDO: automated re-refinement of X-ray structure models in the PDB.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 376, doi. 10.1107/S0021889809008784

By:

Joosten, Robbie P.;
Salzemann, Jean;
Bloch, Vincent;
Stockinger, Heinz;
Berglund, Ann-Charlott;
Blanchet, Christophe;
Bongcam-Rudloff, Erik;
Combet, Christophe;
Da Costa, Ana L.;
Deleage, Gilbert;
Diarena, Matteo;
Fabbretti, Roberto;
Fettahi, Géraldine;
Flegel, Volker;
Gisel, Andreas;
Kasam, Vinod;
Kervinen, Timo;
Korpelainen, Eija;
Mattila, Kimmo;
Pagni, Marco

Publication type:

Article

High-resolution three-dimensional reciprocal-space mapping of InAs nanowires.

Published in:

Journal of Applied Crystallography, 2009, v. 42, n. 3, p. 369, doi. 10.1107/S0021889809009145

By:

Mariager, S. O.;
Lauridsen, S. L.;
Dohn, A.;
Bovet, N.;
Sørensen, C. B.;
Schlepütz, C. M.;
Willmott, P. R.;
Feidenhans'l, R.

Publication type:

Article

Works matching IS 00218898 AND DT 2009 AND VI 42 AND IP 3

calendar of events.

forthcoming meetings.

Richard J. Weiss (1923-2008).

Dominique Grebille (1957-2009).

addenda and errata.

Crystallization columns in a laboratory furnace.

HATODAS II - heavy-atom database system with potentially scoring.

ReX: a computer program for structural analysis using powder diffraction data.

The pseudo-single-crystal method: a third approach to crystal structure determination.

A sample cell for diffraction studies with control of temperature, relative humidity and applied electric field.

Facilitating protein crystal cryoprotection in thick-walled plastic capillaries by high-pressure cryocooling.

Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes.

Determination of the degree of preferred orientation within the March-Dollase approach.

Energy-dispersive diffraction studies of inert anodes.

Anisotropic phonon density of states: the application of Rietveld and Mössbauer texture analysis in aligned powders.

Lattice parameter determination using a curved position-sensitive detector in reflection geometry and application to Sm<sub>x/2</sub>Nd<sub>x/2</sub>Ce<sub>1-x</sub>O<sub>1-δ</sub> ceramics.

High-performance compact-multi-crystal analyzer of X-ray diffractometer scans.

Ultra-small-angle X-ray scattering at the Advanced Photon Source.

On the tetragonality of the room-temparature ferroelectric phase of barium titanate, BatiO<sub>3</sub>.

High-pressure small-angle neutron scattering studies of glucose isomerase conformation in solution.

A prototype environmental gas cell for in situ small-molecule X-ray diffraction.

Size distribution and surface characteristics of silicon nanoparticles.

Enantiomorph identification and stacking faultsin κ-(BEDT-TTF)<sub>2</sub>Cu(NCS)<sub>2</sub> by convergent-beam electron diffraction.

Coordination number in ideal spherical nanocrystals.

Preferred orientation of ettringite in concrete fractures.

Elastic constants of fibre-textured thin films determined by X-ray diffraction.

Morphology and etch figures of a YB: YAI<sub>3</sub>(BO<sub>3</sub>)<sub>4</sub>.

A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films.

High-energy X-ray diffuse scattering.

Implementation and use of robust refinement in powder diffraction in the presence of impurities.

PDB_REDO: automated re-refinement of X-ray structure models in the PDB.

High-resolution three-dimensional reciprocal-space mapping of InAs nanowires.