Works matching IS 23755636 AND DT 2009 AND VI 10 AND IP 2
1
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Article
2
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Laitusis, Cara Cahalan;
- Maneckshana, Behroz;
- Monfils, Lora;
- Ahlgrim-Delzell, Lynn
- Article
3
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Steinberg, Jonathan;
- Cline, Frederick;
- Ling, Guangming;
- Cook, Linda;
- Tognatta, Namrata
- Article
4
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Moen, Ross;
- Liu, Kristi;
- Thurlow, Martha;
- Lekwa, Adam;
- Scullin, Sarah;
- Hausmann, Kristin
- Article
5
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Cook, Linda;
- Eignor, Daniel;
- Steinberg, Jonathan;
- Sawaki, Yasuyo;
- Cline, Frederick
- Article
6
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Article
7
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Article
8
- Journal of Applied Testing Technology, 2009, v. 10, n. 2, p. 1
- Parshall, Cynthia G.;
- Harmes, J. Christine
- Article