Works matching DE "ELECTRONIC appliance testing"
Results: 143
Inhibitor pretreatment synergies demonstrated using a scanning Kelvin probe technique.
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- Corrosion Engineering, Science & Technology, 2003, v. 38, n. 2, p. 112, doi. 10.1179/147842203767789186
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A Frequency Domain Approach for Predicting the Signal Strength of Tsunamis at Coastal Tide Gauges.
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- Journal of Coastal Research, 2014, v. 30, n. 3, p. 562, doi. 10.2112/JCOASTRES-D-13-00076.1
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In vitro assessment of the accuracy of three electronic apex locators.
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- Paediatria Croatica, 2014, v. 58, n. 2, p. 107, doi. 10.13112/pc.627
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Reliability analysis of electronic equipment subjected to shock and vibration – A review.
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- Shock & Vibration, 2009, v. 16, n. 1, p. 45, doi. 10.1155/2009/546053
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Handheld Digital TV Performance Evaluation Method.
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- International Journal of Digital Multimedia Broadcasting, 2008, p. 1, doi. 10.1155/2008/243937
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Quality assessment of varistor ZnO structures by resonant ultrasound spectroscopy.
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- Insight: Non-Destructive Testing & Condition Monitoring, 2009, v. 51, n. 5, p. 262, doi. 10.1784/insi.2009.51.5.262
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Ensuring a High Quality Digital Device through Design for Testability.
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- Journal of Computing & Information Technology, 2012, v. 20, n. 4, p. 235, doi. 10.2498/cit.1001982
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Atomic-level observation with three-dimensional atom probe of the solute behaviour in neutron-, ion- or electron-irradiated ferritic alloys.
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- Philosophical Magazine, 2005, v. 85, n. 4-7, p. 429, doi. 10.1080/02678370412331320233
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Atom probe tomography of radiation-sensitive KS-01 weld.
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- Philosophical Magazine, 2005, v. 85, n. 4-7, p. 401, doi. 10.1080/0267837041233132060
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Testing of axial fans with microperforated housings.
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- Noise Control Engineering Journal, 2016, v. 64, n. 4, p. 511, doi. 10.3397/1/376397
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Group velocity of probe light pulse in an open lambda system.
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- Journal of Modern Optics, 2006, v. 53, n. 8, p. 1165, doi. 10.1080/09500340600552331
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Pad Cratering: Reliability of Assembly Level and Joint Level.
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- Jordan Journal of Mechanical & Industrial Engineering, 2016, v. 10, n. 4, p. 271
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Surface conduction of topological Dirac electrons in bulk insulating Bi<sub>2</sub>Se<sub>3</sub>.
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- Nature Physics, 2012, v. 8, n. 6, p. 460, doi. 10.1038/nphys2286
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ESD Association ESD Handbook Available.
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- Quality & Reliability Engineering International, 1995, v. 11, n. 6, p. 458
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QUALITY AND 1/f NOISE OF ELECTRONIC COMPONENTS.
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- Quality & Reliability Engineering International, 1995, v. 11, n. 3, p. 165, doi. 10.1002/qre.4680110305
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Rules for Component and Assessment Specifications Published.
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- Quality & Reliability Engineering International, 1994, v. 10, n. 6, p. 487
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Phased Array Radar Condition Monitoring.
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- Quality & Reliability Engineering International, 1993, v. 9, n. 3, p. 230
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EOS/ESD Association Approves Three Standards.
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- Quality & Reliability Engineering International, 1993, v. 9, n. 3, p. 227
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New From RAC.
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- Quality & Reliability Engineering International, 1992, v. 8, n. 3, p. 310
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APPLICATION OF WEIBULL PROPORTIONAL HAZARDS MODELLING TO BAD-AS-OLD FAILURE DATA.
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- Quality & Reliability Engineering International, 1991, v. 7, n. 3, p. 149, doi. 10.1002/qre.4680070306
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Disturbance of measurement probe for exposure assessment of a base station antenna near a ground plane.
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- Microwave & Optical Technology Letters, 2006, v. 48, n. 8, p. 1610, doi. 10.1002/mop.21694
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Impact on the Performance of Compact Antenna Test Range due to Surface Deviation of the Reflector.
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- PIERS Proceedings, 2014, p. 771
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Considerations for Incorporating Standby Power Measurement Requirements into DOE Test Procedures.
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- ASHRAE Transactions, 2011, v. 117, n. 2, p. 704
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Safety in numbers. Testing portable appliances in private practices.
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- Podiatry Now, 2009, v. 12, n. 9, p. 47
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Test Technology Newsletter.
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- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
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Test Technology Newsletter.
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- Journal of Electronic Testing, 2016, v. 32, n. 5, p. 507, doi. 10.1007/s10836-016-5612-2
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Test Technology Newsletter.
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- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 123, doi. 10.1007/s10836-013-5366-z
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On Chip Signal Generators for Low Overhead ADC BIST.
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- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 615, doi. 10.1007/s10836-012-5320-5
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Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.
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- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 551, doi. 10.1007/s10836-011-5220-0
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Sensor and Numerical Simulator Evaluation for Porous Medium Desiccation and Rewetting at the Intermediate Laboratory Scale.
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- Vadose Zone Journal, 2012, v. 11, n. 1, p. 23, doi. 10.2136/vzj2011.0089
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Relationships Between Blanking Force and Part Geometry vs. Clearance, Tool Wear, and Sheet Thickness.
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- Quality Engineering, 2002, v. 15, n. 2, p. 197, doi. 10.1081/QEN-120015852
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Measurement System Analysis: The Usual Metrics Can Be Noninformative.
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- Quality Engineering, 2002, v. 15, n. 2, p. 293, doi. 10.1081/QEN-120015861
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DDS Based Standalone Generator Prototype Parameters Evaluation.
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- Measurements, 2007, v. 40, n. 2, p. 8
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SPECTRO VNA ADVANCES VECTOR NETWORK ANALYZER CAPABILITIES.
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- Microwave Journal, 2011, v. 54, n. 7, p. 114
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Test Equipment.
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- Microwave Journal, 2011, v. 54, n. 6, p. 138
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THE MASTERS OF MIMO: EMBRACING COMPLEXITY: MIMO OVER-THE-AIR TESTING WITH THE REVERBERATION CHAMBER.
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- Microwave Journal, 2010, v. 53, n. 8, p. 66
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THE MASTERS OF MIMO: CREATING A COMPLEX MULTIPATH ENVIRONMENT SIMULATION IN AN ANECHOIC CHAMBER.
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- Microwave Journal, 2010, v. 53, n. 8, p. 56
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THE MIMO ANTENNA: UNSEEN, UNLOVED, UNTESTED!
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- Microwave Journal, 2010, v. 53, n. 8, p. 22
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PORTABLE 6.4 GHZ RF SIGNAL GENERATOR.
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- Microwave Journal, 2009, v. 52, n. 5, p. 236
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HIGH-REP-RATE PULSER/SAMPLER-BASED 60 GHx WPAN IC CAN ELIMINATE MIXER, DOUBLER, PA, PLL DIVIDE CHAIN, CUTTING SIZE, POWER AND COST.
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- Microwave Journal, 2008, v. 51, n. 8, p. 93
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MONOLITHIC SAMPLER/PULSER ARCHITECTURE EXCEEDS 100 GHZ.
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- Microwave Journal, 2008, v. 51, n. 8, p. 86
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A KU-BAND 4-BIT COMPAQ OCTAVE BANDWIDTH GAAS MMIC PHASE SHIFTER.
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- Microwave Journal, 2008, v. 51, n. 6, p. 30
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MEASURING PERFORMANCE IN PULSED SIGNAL DEVICES: A MULTI-FACETED CHALLENGE.
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- Microwave Journal, 2007, v. 50, n. 9, p. 196
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Analog Signal Generator.
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- Microwave Journal, 2006, v. 49, n. 6, p. 140
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A VECTOR SIGNAL GENERATOR FOR PRODUCTION APPLICATIONS.
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- Microwave Journal, 2005, v. 48, n. 3, p. 160
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A 4 GHZ FRACTIONAL-N SYNTHESIZER FOR MULTI-MODE WIRELESS APPLICATIONS.
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- Microwave Journal, 2003, v. 46, n. 7, p. 88
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DROP TESTER WITH ORIENTATION REPEATABILITY FOR ELECTRONIC PRODUCTS.
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- Experimental Techniques, 2006, v. 30, n. 6, p. 31, doi. 10.1111/j.1747-1567.2006.00104.x
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Negative four-terminal resistance as a probe of crossed Andreev reflection.
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- Applied Physics A: Materials Science & Processing, 2007, v. 89, n. 3, p. 603, doi. 10.1007/s00339-007-4193-4
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Single-line-to-ground fault location in the compensated distribution network.
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- Australian Journal of Electrical & Electronic Engineering, 2013, v. 10, n. 4, p. 449, doi. 10.7158/1448837x.2013.11464394
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A New Approach for Multi-Emitter Test Signal Generation.
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- EE: Evaluation Engineering, 2013, v. 52, n. 12, p. 20
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