Works matching IS 09238174 AND DT 2008 AND VI 24 AND IP 4
Results: 10
Test Technology Newsletter August 2008.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 323, doi. 10.1007/s10836-008-5075-1
- Publication type:
- Article
Editorial.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 321, doi. 10.1007/s10836-008-5076-0
- By:
- Publication type:
- Article
On Composite Leakage Current Maximization.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 405, doi. 10.1007/s10836-007-5049-8
- By:
- Publication type:
- Article
Guest Editorial.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 325, doi. 10.1007/s10836-008-5063-5
- By:
- Publication type:
- Article
Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 327, doi. 10.1007/s10836-007-5048-9
- By:
- Publication type:
- Article
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 353, doi. 10.1007/s10836-007-5053-z
- By:
- Publication type:
- Article
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 393
- By:
- Publication type:
- Article
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 365, doi. 10.1007/s10836-008-5062-6
- By:
- Publication type:
- Article
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 379, doi. 10.1007/s10836-007-5033-3
- By:
- Publication type:
- Article
Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations.
- Published in:
- Journal of Electronic Testing, 2008, v. 24, n. 4, p. 335, doi. 10.1007/s10836-007-5021-7
- By:
- Publication type:
- Article