Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 3
1
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 305, doi. 10.1093/jmicro/53.3.305
- Anindito Sen;
- Ranjan K. Nandy;
- Amar N. Ghosh
- Article
2
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 257, doi. 10.1093/jmicro/53.3.257
- Yiping Peng;
- Peter D. Nellist;
- Stephen J. Pennycook
- Article
3
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 267, doi. 10.1093/jmicro/53.3.267
- Article
4
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 245, doi. 10.1093/jmicro/53.3.245
- Article
5
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 237, doi. 10.1093/jmicro/53.3.237
- Article
6
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 293
- Article
7
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 229, doi. 10.1093/jmicro/53.3.229
- Kaoru Ohya;
- Tohru Ishitani
- Article
8
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 277
- Article
9
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 223, doi. 10.1093/jmicro/53.3.223
- Shinichi Igarashi;
- Masaharu Haraguchi;
- Jun Aihara;
- Takeru Saito;
- Kenji Yamaguchi;
- Hiroyuki Yamamoto;
- Kiichi Hojou
- Article
10
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 281, doi. 10.1093/jmicro/53.3.281
- Jacob S. Ishay;
- Vitaly Pertsis;
- Ehud Skutelsky;
- Dharamdajal Kalicharan;
- Hans van der Want
- Article
11
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 271, doi. 10.1093/jmicro/53.3.271
- Article
12
- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 217, doi. 10.1093/jmicro/53.3.217
- Article