Works matching DE "INTEGRATED circuits industry"


Results: 172
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    It's Europe's turn now.

    Published in:
    Solid State Technology, 2001, v. 44, n. 4, p. S1
    By:
    • DeFerm, Ludo
    Publication type:
    Article
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    We need better factories.

    Published in:
    Solid State Technology, 2000, v. 43, n. 6, p. 14
    By:
    • Haavind, Robert
    Publication type:
    Article
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    Worldwide highlights.

    Published in:
    Solid State Technology, 1999, v. 42, n. 11, p. 14
    Publication type:
    Article
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    Fab for lease.

    Published in:
    Solid State Technology, 1998, v. 41, n. 4, p. 40
    Publication type:
    Article
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    Calendar.

    Published in:
    2007
    Publication type:
    Calendar
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    News.

    Published in:
    Electronics Systems & Software, 2006, v. 4, n. 5, p. 4, doi. 10.1049/ess:20060510
    Publication type:
    Article
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    News.

    Published in:
    Electronics Systems & Software, 2006, v. 4, n. 1, p. 4, doi. 10.1049/ess:20060109
    Publication type:
    Article
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    正硅酸甲酯制备的研究进展.

    Published in:
    Eco-Industry Science & Phosphorus Fluorine Engineering, 2024, v. 39, n. 12, p. 50
    By:
    • 胡国涛;
    • 黄家兴;
    • 柳陈军;
    • 陈广鹏
    Publication type:
    Article
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    Current Trends in Integrated Circuits.

    Published in:
    Financial Analysts Journal, 1967, v. 23, n. 5, p. 65, doi. 10.2469/faj.v23.n5.65
    By:
    • Sarlo, George S.;
    • Longley, F. Alan
    Publication type:
    Article
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    Applying Advanced Fault Models.

    Published in:
    EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 48
    By:
    • Jayaram, Vinay;
    • Hay, Cy;
    • Kapur, Rohit
    Publication type:
    Article
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    CTL: The New Language of DFT.

    Published in:
    EE: Evaluation Engineering, 2003, v. 42, n. 10, p. 20
    By:
    • Miller, Kathleen R.;
    • Lonowski, Wayne J.;
    • Kapur, Rohit;
    • Harrod, Peter;
    • Appello, Davide
    Publication type:
    Article
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    When Size Does Matter.

    Published in:
    Manufacturing Engineer, 2005, v. 84, n. 2, p. 6, doi. 10.1049/me:20050212
    By:
    • Venables, Mark
    Publication type:
    Article