Works matching DE "INTEGRATED circuits industry"
1
- Solid State Technology, 2001, v. 44, n. 9, p. 47
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2
- Solid State Technology, 2001, v. 44, n. 3, p. 113
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3
- Solid State Technology, 2001, v. 44, n. 4, p. 166
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4
- Solid State Technology, 2001, v. 44, n. 4, p. S1
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5
- Solid State Technology, 2001, v. 44, n. 4, p. 40
- Kimura, Masahide;
- Microdevices, Nikkei
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6
- Solid State Technology, 2000, v. 43, n. 6, p. 14
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7
- Solid State Technology, 2000, v. 43, n. 5, p. 18
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8
- Solid State Technology, 2000, v. 43, n. 5, p. 18
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9
- Solid State Technology, 1999, v. 42, n. 11, p. 14
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10
- Solid State Technology, 1999, v. 42, n. 3, p. 26
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11
- Solid State Technology, 1999, v. 42, n. 2, p. 24
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12
- Solid State Technology, 1999, v. 42, n. 2, p. 18
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13
- Solid State Technology, 1999, v. 42, n. 1, p. 14
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14
- Solid State Technology, 1998, v. 41, n. 10, p. 54
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15
- Solid State Technology, 1998, v. 41, n. 4, p. 40
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16
- Solid State Technology, 1998, v. 41, n. 3, p. 22
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17
- Solid State Technology, 1997, v. 40, n. 12, p. 34
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19
- R&D Management, 2003, v. 33, n. 4, p. 425, doi. 10.1111/1467-9310.00308
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20
- R&D Management, 1997, v. 27, n. 1, p. 5, doi. 10.1111/1467-9310.00038
- Murphy, Steven A.;
- Kumar, Vinod
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22
- Electronics Systems & Software, 2006, v. 4, n. 5, p. 4, doi. 10.1049/ess:20060510
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23
- Electronics Systems & Software, 2006, v. 4, n. 1, p. 4, doi. 10.1049/ess:20060109
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24
- Electronics Systems & Software, 2005, v. 3, n. 6, p. 9
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25
- Electronics Systems & Software, 2005, v. 3, n. 5, p. 4
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26
- Electronics Systems & Software, 2005, v. 3, n. 5, p. 5
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27
- Electronics Systems & Software, 2005, v. 3, n. 5, p. 46
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29
- Eco-Industry Science & Phosphorus Fluorine Engineering, 2024, v. 39, n. 12, p. 50
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30
- Journal of Product Innovation Management, 2015, v. 32, n. 4, p. 556, doi. 10.1111/jpim.12253
- Vanhaverbeke, Wim;
- Belderbos, Réne;
- Duysters, Geert;
- Beerkens, Bonnie
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31
- Financial Analysts Journal, 1967, v. 23, n. 5, p. 65, doi. 10.2469/faj.v23.n5.65
- Sarlo, George S.;
- Longley, F. Alan
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32
- China Business Review, 2016, p. 1
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33
- China Business Review, 2014, p. 1
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34
- Electrotechnical Review / Elektrotehniski Vestnik, 2017, v. 84, n. 1/2, p. 7
- R., Sree Ranjani;
- M., Nirmala Devi
- Article
35
- Applied Economics, 2011, v. 43, n. 22, p. 2993, doi. 10.1080/00036840903357348
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36
- Production & Operations Management, 2024, v. 33, n. 9, p. 1821, doi. 10.1177/10591478241260432
- Clottey, Toyin;
- Benton Jr., WC
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37
- EE: Evaluation Engineering, 2005, v. 44, n. 7, p. 68
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38
- EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 48
- Jayaram, Vinay;
- Hay, Cy;
- Kapur, Rohit
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39
- EE: Evaluation Engineering, 2003, v. 42, n. 10, p. 20
- Miller, Kathleen R.;
- Lonowski, Wayne J.;
- Kapur, Rohit;
- Harrod, Peter;
- Appello, Davide
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40
- ComputerWorld Hong Kong, 2009, v. 26, n. 5, p. 75
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41
- Research Technology Management, 1999, v. 42, n. 2, p. 2
- Wolff, M. F.;
- Gwynne, Peter
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42
- Research Technology Management, 1998, v. 41, n. 6, p. 6
- Wolff, M. F.;
- Nathan, Richard
- Article
43
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 653, doi. 10.1007/s10836-012-5299-y
- Kulovic, Kemal;
- Margala, Martin
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44
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 389, doi. 10.1007/s10836-007-5014-6
- P. Bernardi;
- M. Grosso;
- M. Rebaudengo;
- M. Sonza Reorda
- Article
45
- Instrumentation Science & Technology, 2022, v. 50, n. 2, p. 118, doi. 10.1080/10739149.2021.1967973
- Alam, Shamim;
- Khan, Shakeb A.;
- Mittal, Upendra;
- Islam, Tarikul
- Article
46
- Photonics, 2023, v. 10, n. 4, p. 351, doi. 10.3390/photonics10040351
- Jiang, Wenbo;
- Wang, Huaran;
- Xie, Wenda;
- Qu, Zhefei
- Article
47
- Business History Review, 2012, v. 86, n. 4, p. 773, doi. 10.1017/S0007680512001821
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48
- SERI Quarterly, 2013, v. 6, n. 4, p. 25
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49
- Journal of Electronic Materials, 2021, v. 50, n. 10, p. 5639, doi. 10.1007/s11664-021-09102-4
- Jang, Jun-Ho;
- Min, Kyung Deuk;
- Lee, Choong-Jae;
- Hwang, Byeong-Uk;
- Jung, Seung-Boo
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50
- Manufacturing Engineer, 2005, v. 84, n. 2, p. 6, doi. 10.1049/me:20050212
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