Works matching IS 1537-0755 AND VI 24 AND IP 2 AND DT 2022
1
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 51, doi. 10.31399/asm.edfa.2022-2.p051
- Article
2
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 50
- Article
3
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 48
- Article
4
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 37
- Article
5
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 37
- Article
6
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 37
- Article
7
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 47
- Article
8
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 40
- Article
9
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 38
- Article
10
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 46
- Article
11
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 44
- Article
12
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 42
- Article
13
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 34
- Aysu, Aydin;
- Xu Chen;
- Davis, W. Rhett;
- Sung Kyu Lim;
- Franzon, Paul;
- Swaminathan, Madhavan;
- Rosenbaum, Elyse
- Article
14
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 24, doi. 10.31399/asm.edfa.2022-2.p024
- Khan, Aslam A.;
- Chengji Xi;
- Asadizanjani, Navid
- Article
15
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 18, doi. 10.31399/asm.edfa.2022-2.p018
- Adhikari, Nirmal;
- Kaszuba, Phil;
- Mathieu, Gaitan;
- Dahanayaka, Daminda
- Article
16
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 12, doi. 10.31399/asm.edfa.2022-2.p012
- Rummel, Andreas;
- Smith, Andrew Jonathan
- Article
17
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 11
- Article
18
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 11
- Article
19
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 4, doi. 10.31399/asm.edfa.2022-2.p004
- Xuming Deng;
- Weidong Huang;
- Changhong Yu;
- Xiongjian Wu;
- Yang Xu;
- Xiaole Zhao;
- Qing Gu
- Article
20
- Electronic Device Failure Analysis, 2022, v. 24, n. 2, p. 2
- Article