Novel Architecture for Logic Test Using Single Cycle Access Structure.
- Published in:
- Journal of VLSI Circuits & Systems (JVCS), 2021, v. 3, n. 1, p. 1, doi. 10.31838/jvcs/03.01.01
- By:
- Publication type:
- Article
Works matching DE "AUTOMATIC test pattern generation"
Results: 25
1
2
Input vulnerability-aware approximate triple modular redundancy: higher fault coverage, improved search space, and reduced area overhead.
- Published in:
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 934, doi. 10.1049/el.2018.1042
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- Publication type:
- Article
3
How to Optimize the Use of SAT and SMT Solvers for Test Generation of Boolean Expressions.
- Published in:
- Computer Journal, 2015, v. 58, n. 11, p. 2900, doi. 10.1093/comjnl/bxv001
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- Publication type:
- Article
4
SAT-based ATPG beyond stuck-at fault testing.
- Published in:
- IT: Information Technology, 2014, v. 56, n. 4, p. 165, doi. 10.1515/itit-2013-1043
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- Publication type:
- Article
5
An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 5, p. 511, doi. 10.1007/s10836-018-5747-4
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- Publication type:
- Article
6
Editorial.
- Published in:
- 2018
- By:
- Publication type:
- Editorial
7
<bold>New Editor - 2018</bold>.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 1, p. 3, doi. 10.1007/s10836-018-5711-3
- Publication type:
- Article
8
Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 1, p. 53, doi. 10.1007/s10836-018-5703-3
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- Publication type:
- Article
9
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 751, doi. 10.1007/s10836-017-5693-6
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- Publication type:
- Article
10
An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 721, doi. 10.1007/s10836-016-5621-1
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- Publication type:
- Article
11
CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 5, p. 625, doi. 10.1007/s10836-016-5615-z
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- Publication type:
- Article
12
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 763, doi. 10.1007/s10836-014-5490-4
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- Publication type:
- Article
13
Input-Aware Implication Selection Scheme Utilizing ATPG for Efficient Concurrent Error Detection.
- Published in:
- Electronics (2079-9292), 2018, v. 7, n. 10, p. 258, doi. 10.3390/electronics7100258
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- Publication type:
- Article
14
New test points help contain growing test costs.
- Published in:
- EE: Evaluation Engineering, 2017, v. 56, n. 11, p. 16
- By:
- Publication type:
- Article
15
Horizontal diversity in test generation for high fault coverage.
- Published in:
- Turkish Journal of Electrical Engineering & Computer Sciences, 2018, v. 26, n. 6, p. 3258, doi. 10.3906/elk-1805-212
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- Publication type:
- Article
16
I-athlon: Toward a Multidimensional Turing Test.
- Published in:
- AI Magazine, 2016, v. 37, n. 1, p. 78, doi. 10.1609/aimag.v37i1.2643
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- Publication type:
- Article
17
Test Data Compression Using Multiple Run Length Code Technique.
- Published in:
- International Review on Computers & Software, 2014, v. 9, n. 1, p. 197
- By:
- Publication type:
- Article
18
Synthesis of auxiliary algorithms for preliminary assessment of stuck-at faults detection tests.
- Published in:
- Automation & Remote Control, 2014, v. 75, n. 10, p. 1875, doi. 10.1134/S0005117914100142
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- Publication type:
- Article
19
面向Web服务测试的单线执行序列生成方法.
- Published in:
- Computer Engineering & Science / Jisuanji Gongcheng yu Kexue, 2019, v. 41, n. 6, p. 1034, doi. 10.3969/j.issn.1007-130X.2019.06.011
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- Publication type:
- Article
20
Networked distributed automatic generation control of power system with dynamic participation of wind turbines through uncertain delayed communication network.
- Published in:
- IET Renewable Power Generation (Wiley-Blackwell), 2017, v. 11, n. 8, p. 1254, doi. 10.1049/iet-rpg.2016.0508
- By:
- Publication type:
- Article
21
Identifying transistor-level yield limiters in the FinFET era.
- Published in:
- EE: Evaluation Engineering, 2017, v. 56, n. 5, p. 18
- By:
- Publication type:
- Article
22
Hybrid approach combines ATPG and LBIST.
- Published in:
- 2016
- Publication type:
- Product Review
23
ATPG keeps pace with design complexity.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 10, p. 20
- By:
- Publication type:
- Article
24
Reducing Defect Rates With Cell-Aware Testing.
- Published in:
- EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 26
- By:
- Publication type:
- Article
25
Addressing New Requirements for Legacy Test Stations.
- Published in:
- EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 16
- By:
- Publication type:
- Article