Works matching DE "ELECTRONICS conventions"
3
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
- Article
4
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 109, doi. 10.1007/s10836-016-5575-3
- Article
5
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 337, doi. 10.1007/s10836-015-5539-z
- Article
6
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
- Article
7
- Journal of Electronic Testing, 2014, v. 30, n. 1, p. 7, doi. 10.1007/s10836-014-5434-z
- Article
8
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 455, doi. 10.1007/s10836-013-5395-7
- Article
13
- Chemistry & Industry, 2008, n. 13, p. 14
- Article
14
- Journal of Electronic Materials, 2009, v. 38, n. 11, p. 2211, doi. 10.1007/s11664-009-0935-8
- Chen, Chih-ming;
- Chada, Srinivas;
- Chen, Sinn-wen;
- Flandorfer, Hans;
- Lindsay Greer, A.;
- Lee, Jae-ho;
- Zeng, Kejun;
- Yen, Yee-wen;
- Gierlotka, Wojciech;
- Wang, Chao-hong
- Article
17
- 2008
- Avrutin, Eugene;
- Tomić, Stanko;
- Witzigmann, Bernd;
- Yoder, Douglas
- Proceeding
18
- Health Care Financing Review, 1992, v. 13, n. 4, p. 204
- Article
34
- Electronic Device Failure Analysis, 2010, v. 12, n. 1, p. 35
- Article
38
- Journal of Failure Analysis & Prevention, 2016, v. 16, n. 5, p. 728, doi. 10.1007/s11668-016-0176-0
- Article
39
- Integrated Ferroelectrics, 2007, v. 92, n. 1, p. 1, doi. 10.1080/10584580701743902
- Gregg, J. M.;
- Scott, J. F.
- Article
40
- Ferroelectrics, 2008, v. 372, n. 1, p. 5, doi. 10.1080/00150190802435526
- Luk'yanchuk, Igor;
- Mezzane, Daoud
- Article
41
- Micromachines, 2017, v. 8, n. 4, p. 129, doi. 10.3390/mi8040129
- Zhigang Wu;
- Yongan Huang;
- Rong Chen
- Article
50
- 2013
- Dai, Jiyan;
- Auciello, Orlando;
- Chan, Helen
- Editorial