Works matching DE "LINCOLN Laboratory"
1
- Solid State Technology, 1998, v. 41, n. 10, p. 44
- Article
2
- International Journal of High Speed Electronics & Systems, 2008, v. 18, n. 3, p. 639, doi. 10.1142/S0129156408005631
- RICHARDSON, JONATHAN M.;
- ALDRIDGE, JOHN C.
- Article
3
- Journal of Counterterrorism & Homeland Security International, 2011, v. 17, n. 4, p. 7
- Article
4
- Quality & Reliability Engineering International, 2014, v. 30, n. 2, p. 257, doi. 10.1002/qre.1494
- Park, Yongro;
- Baek, Seung Hyun;
- Kim, Seong ‐ Hee;
- Tsui, Kwok ‐ Leung
- Article
5
- Optical Engineering, 2014, v. 53, n. 2, p. 1, doi. 10.1117/1.OE.53.2.021103
- Wynn, Charles M.;
- Palmacci, Stephen;
- Clark, Michelle L.;
- Kunz, Roderick R.
- Article
6
- Journal of Intelligent Manufacturing, 2010, v. 21, n. 5, p. 623, doi. 10.1007/s10845-008-0204-3
- Sardana, Anjali;
- Joshi, R. C.;
- Tai-hoon Kim;
- Sung Jang
- Article
7
- Advanced Materials & Processes, 2007, v. 165, n. 3, p. 10
- Article
8
- Astronomy & Geophysics, 2012, v. 53, n. 5, p. 5.08, doi. 10.1111/j.1468-4004.2012.53504_20.x
- Article
9
- Journal of the British Astronomical Association, 2014, v. 124, n. 5, p. 254
- Article